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Utilizing large hall offset voltage for conversion free 4H-SiC strain sensor
This work presents a conversion free p-type 4H silicon carbide (4H-SiC) four-terminal strain sensor utilizing a large Hall offset voltage in a symmetric four-terminal configuration. Upon the application of mechanical strain, a high sensitivity of 209 mV/A/ppm was obtained. The strain sensor also exh...
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creator | Nguyen, Tuan-Khoa Phan, Hoang-Phuong Han, Jisheng Dinh, Toan MdFoisal, Abu Riduan Zhu, Yong Nguyen, Nam-Trung Dao, Dzung Viet |
description | This work presents a conversion free p-type 4H silicon carbide (4H-SiC) four-terminal strain sensor utilizing a large Hall offset voltage in a symmetric four-terminal configuration. Upon the application of mechanical strain, a high sensitivity of 209 mV/A/ppm was obtained. The strain sensor also exhibited good repeatability and linearity with a significantly large offset voltage in the induced strain ranging from 0 to 334ppm. Coupled these performances with the excellent mechanical strength, electrical conductivity, thermal stability, and chemical inertness of the SiC material, the proposed 4H-SiC strain sensor is promising for stress/strain monitoring for harsh operating environments with high signal-to-noise ratio. |
doi_str_mv | 10.1109/MEMSYS.2018.8346697 |
format | conference_proceeding |
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Coupled these performances with the excellent mechanical strength, electrical conductivity, thermal stability, and chemical inertness of the SiC material, the proposed 4H-SiC strain sensor is promising for stress/strain monitoring for harsh operating environments with high signal-to-noise ratio.</description><identifier>EISSN: 2160-1968</identifier><identifier>EISBN: 9781538647820</identifier><identifier>EISBN: 1538647826</identifier><identifier>DOI: 10.1109/MEMSYS.2018.8346697</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitive sensors ; Monitoring ; Sensitivity ; Silicon carbide ; Strain ; Temperature sensors</subject><ispartof>2018 IEEE Micro Electro Mechanical Systems (MEMS), 2018, p.882-885</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8346697$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,27925,54555,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8346697$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Nguyen, Tuan-Khoa</creatorcontrib><creatorcontrib>Phan, Hoang-Phuong</creatorcontrib><creatorcontrib>Han, Jisheng</creatorcontrib><creatorcontrib>Dinh, Toan</creatorcontrib><creatorcontrib>MdFoisal, Abu Riduan</creatorcontrib><creatorcontrib>Zhu, Yong</creatorcontrib><creatorcontrib>Nguyen, Nam-Trung</creatorcontrib><creatorcontrib>Dao, Dzung Viet</creatorcontrib><title>Utilizing large hall offset voltage for conversion free 4H-SiC strain sensor</title><title>2018 IEEE Micro Electro Mechanical Systems (MEMS)</title><addtitle>MEMSYS</addtitle><description>This work presents a conversion free p-type 4H silicon carbide (4H-SiC) four-terminal strain sensor utilizing a large Hall offset voltage in a symmetric four-terminal configuration. Upon the application of mechanical strain, a high sensitivity of 209 mV/A/ppm was obtained. The strain sensor also exhibited good repeatability and linearity with a significantly large offset voltage in the induced strain ranging from 0 to 334ppm. Coupled these performances with the excellent mechanical strength, electrical conductivity, thermal stability, and chemical inertness of the SiC material, the proposed 4H-SiC strain sensor is promising for stress/strain monitoring for harsh operating environments with high signal-to-noise ratio.</description><subject>Capacitive sensors</subject><subject>Monitoring</subject><subject>Sensitivity</subject><subject>Silicon carbide</subject><subject>Strain</subject><subject>Temperature sensors</subject><issn>2160-1968</issn><isbn>9781538647820</isbn><isbn>1538647826</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2018</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj99KwzAchaMgOGafYDd5gdb80jR_LqVMJ3Tsou7Cq5GmyYzERpIy0Ke34M7NgXPxcT6ENkAqAKIe99t9_95XlICsZM04V-IGFUpIaGrJmZCU3KIVBU5KUFzeoyLnT7JEMQoUVqg7zj74Xz-dcdDpbPGHDgFH57Kd8SWGWS-biwmbOF1syj5O2CVrMduVvW9xnpP2E852yjE9oDunQ7bFtdfo-Lx9a3dld3h5bZ-60lNK5pIbSkcFbFRNY4jTyx0YpaADU1QYIIYwLo1wDXFi0M5J3QCXA6tHahcLV6_R5p_rrbWn7-S_dPo5Xf3rPz_3TqA</recordid><startdate>20180101</startdate><enddate>20180101</enddate><creator>Nguyen, Tuan-Khoa</creator><creator>Phan, Hoang-Phuong</creator><creator>Han, Jisheng</creator><creator>Dinh, Toan</creator><creator>MdFoisal, Abu Riduan</creator><creator>Zhu, Yong</creator><creator>Nguyen, Nam-Trung</creator><creator>Dao, Dzung Viet</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>20180101</creationdate><title>Utilizing large hall offset voltage for conversion free 4H-SiC strain sensor</title><author>Nguyen, Tuan-Khoa ; Phan, Hoang-Phuong ; Han, Jisheng ; Dinh, Toan ; MdFoisal, Abu Riduan ; Zhu, Yong ; Nguyen, Nam-Trung ; Dao, Dzung Viet</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i220t-6c22d914d955c0fa0001d872b4927c10c0468c7f50f7baff8a5168b43d2e196f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Capacitive sensors</topic><topic>Monitoring</topic><topic>Sensitivity</topic><topic>Silicon carbide</topic><topic>Strain</topic><topic>Temperature sensors</topic><toplevel>online_resources</toplevel><creatorcontrib>Nguyen, Tuan-Khoa</creatorcontrib><creatorcontrib>Phan, Hoang-Phuong</creatorcontrib><creatorcontrib>Han, Jisheng</creatorcontrib><creatorcontrib>Dinh, Toan</creatorcontrib><creatorcontrib>MdFoisal, Abu Riduan</creatorcontrib><creatorcontrib>Zhu, Yong</creatorcontrib><creatorcontrib>Nguyen, Nam-Trung</creatorcontrib><creatorcontrib>Dao, Dzung Viet</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Nguyen, Tuan-Khoa</au><au>Phan, Hoang-Phuong</au><au>Han, Jisheng</au><au>Dinh, Toan</au><au>MdFoisal, Abu Riduan</au><au>Zhu, Yong</au><au>Nguyen, Nam-Trung</au><au>Dao, Dzung Viet</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Utilizing large hall offset voltage for conversion free 4H-SiC strain sensor</atitle><btitle>2018 IEEE Micro Electro Mechanical Systems (MEMS)</btitle><stitle>MEMSYS</stitle><date>2018-01-01</date><risdate>2018</risdate><spage>882</spage><epage>885</epage><pages>882-885</pages><eissn>2160-1968</eissn><eisbn>9781538647820</eisbn><eisbn>1538647826</eisbn><abstract>This work presents a conversion free p-type 4H silicon carbide (4H-SiC) four-terminal strain sensor utilizing a large Hall offset voltage in a symmetric four-terminal configuration. Upon the application of mechanical strain, a high sensitivity of 209 mV/A/ppm was obtained. The strain sensor also exhibited good repeatability and linearity with a significantly large offset voltage in the induced strain ranging from 0 to 334ppm. Coupled these performances with the excellent mechanical strength, electrical conductivity, thermal stability, and chemical inertness of the SiC material, the proposed 4H-SiC strain sensor is promising for stress/strain monitoring for harsh operating environments with high signal-to-noise ratio.</abstract><pub>IEEE</pub><doi>10.1109/MEMSYS.2018.8346697</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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issn | 2160-1968 |
language | eng |
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source | IEEE Xplore All Conference Series |
subjects | Capacitive sensors Monitoring Sensitivity Silicon carbide Strain Temperature sensors |
title | Utilizing large hall offset voltage for conversion free 4H-SiC strain sensor |
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