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Patterning challenges for monolithic silicon photonics: AP/DFM: Advanced patterning / design for manufacturability
The curvilinear geometries of photonic devices are fundamentally different than the rectilinear designs of existing CMOS devices. In a monolithic integration of CMOS and photonic components, process changes to the conventional flow are required to accommodate the unique geometries of photonic device...
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creator | Meagher, Colleen Sowinski, Zoey Yu, Chienfan Hu, Shuren Nummy, Karen Ghosal, Mini Modh Viswanathan, Ramya Abdo, Amr Wiltshire, Tim |
description | The curvilinear geometries of photonic devices are fundamentally different than the rectilinear designs of existing CMOS devices. In a monolithic integration of CMOS and photonic components, process changes to the conventional flow are required to accommodate the unique geometries of photonic devices. In this paper we discuss changes made in both fab processing and Optical Proximity Correction to improve the optical performance on a monolithic 90nm technology. |
doi_str_mv | 10.1109/ASMC.2018.8373178 |
format | conference_proceeding |
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identifier | EISSN: 2376-6697 |
ispartof | 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018, p.155-158 |
issn | 2376-6697 |
language | eng |
recordid | cdi_ieee_primary_8373178 |
source | IEEE Xplore All Conference Series |
subjects | Couplers monolithic Optical fiber couplers Optical fiber devices optical proximity correction Photonics Semiconductor device modeling Silicon Silicon photonics |
title | Patterning challenges for monolithic silicon photonics: AP/DFM: Advanced patterning / design for manufacturability |
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