Three Port Non-Linear Characterization of Power Amplifiers under Modulated Excitations Using a Vector Network Analyzer Platform

This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband curr...

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Bibliographic Details
Main Authors: Angelotti, Alberto Maria, Gibiino, Gian Piero, Nielsen, Troels, Tafuri, Felice Francesco, Santarelli, Alberto
Format: Conference Proceeding
Language:English
Subjects:
Bandwidth
behavioral modeling
Current measurement
Distortion measurement
Frequency measurement
Large signal network analysis
nonlinear measurements
Probes
Radio frequency
three-port behavioral modeling
Voltage measurement
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Description
Summary:This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband current/voltage measurements on the supply terminal of the amplifier across several MHz of bandwidth. As an application example, full three-port measurements of a 2-W gallium nitride (GaN) PA are reported.
ISSN:2576-7216
DOI:10.1109/MWSYM.2018.8439845