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Conception of a Dual-band Six-port Based Reflectometer
In this paper, we propose a dual-band six-port based reflectometer designed and implemented using a six-port junction and a four-channel diode detector to measure the reflection coefficient of an unknown load. The proposed reflectometer has been implemented to operate at two frequencies of 1.5 GHz a...
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creator | Chagtmi, Nadia Boulejfen, Noureddine Ghannouchi, Fadhel M. |
description | In this paper, we propose a dual-band six-port based reflectometer designed and implemented using a six-port junction and a four-channel diode detector to measure the reflection coefficient of an unknown load. The proposed reflectometer has been implemented to operate at two frequencies of 1.5 GHz and 2.7 GHz. A linear calibration procedure using five standards has been used to identify the calibration matrix that characterizes the six-port reflectometer. This matrix is used then during measurement to compensate for the reflectometer imperfections and identify the reflection coefficient of the load under test. The experimental results showed that the proposed dual-band reflectometer provides a good accuracy in terms of measurement accuracy compared to the commercial N5230A PNA-L high performance Agilent Network Analyzer with a much lower implementation cost. |
doi_str_mv | 10.1109/MMS.2017.8497162 |
format | conference_proceeding |
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The proposed reflectometer has been implemented to operate at two frequencies of 1.5 GHz and 2.7 GHz. A linear calibration procedure using five standards has been used to identify the calibration matrix that characterizes the six-port reflectometer. This matrix is used then during measurement to compensate for the reflectometer imperfections and identify the reflection coefficient of the load under test. 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The proposed reflectometer has been implemented to operate at two frequencies of 1.5 GHz and 2.7 GHz. A linear calibration procedure using five standards has been used to identify the calibration matrix that characterizes the six-port reflectometer. This matrix is used then during measurement to compensate for the reflectometer imperfections and identify the reflection coefficient of the load under test. The experimental results showed that the proposed dual-band reflectometer provides a good accuracy in terms of measurement accuracy compared to the commercial N5230A PNA-L high performance Agilent Network Analyzer with a much lower implementation cost.</description><subject>Calibration</subject><subject>Detectors</subject><subject>Dual band</subject><subject>five standards</subject><subject>Junctions</subject><subject>Linear calibration</subject><subject>Microwave theory and techniques</subject><subject>Reflection coefficient</subject><subject>Six-port reflectometer</subject><issn>2157-9830</issn><isbn>9781538655757</isbn><isbn>1538655756</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2017</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj0tLxDAURqMgOIzdC27yB1LvTZrXUusTZhCc2Q9pcgOVTlvaCvrvHXC-zVmdAx9jtwglIvj77XZXSkBbuspbNPKCFd461MoZra22l2wlUVvhnYJrVszzF5xmACsLK2bqoY80Lu3Q8yHzwJ--Qyea0Ce-a3_EOEwLfwwzJf5JuaO4DEdaaLphVzl0MxVnrtn-5Xlfv4nNx-t7_bARLVq9CFJJBaqqlB0RSfCAUgYgMKFJEaTOHnUyMmCKscmQAVKysXEpeEtSrdndf7Y96Ydxao9h-j2cj6o_gClGeQ</recordid><startdate>201711</startdate><enddate>201711</enddate><creator>Chagtmi, Nadia</creator><creator>Boulejfen, Noureddine</creator><creator>Ghannouchi, Fadhel M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201711</creationdate><title>Conception of a Dual-band Six-port Based Reflectometer</title><author>Chagtmi, Nadia ; Boulejfen, Noureddine ; Ghannouchi, Fadhel M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-e3d3ae44df8eee2090122a0e06abdc025f915d62a1dccbf0f00dd7cb8da97e23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Calibration</topic><topic>Detectors</topic><topic>Dual band</topic><topic>five standards</topic><topic>Junctions</topic><topic>Linear calibration</topic><topic>Microwave theory and techniques</topic><topic>Reflection coefficient</topic><topic>Six-port reflectometer</topic><toplevel>online_resources</toplevel><creatorcontrib>Chagtmi, Nadia</creatorcontrib><creatorcontrib>Boulejfen, Noureddine</creatorcontrib><creatorcontrib>Ghannouchi, Fadhel M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore (Online service)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chagtmi, Nadia</au><au>Boulejfen, Noureddine</au><au>Ghannouchi, Fadhel M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Conception of a Dual-band Six-port Based Reflectometer</atitle><btitle>2017 Mediterranean Microwave Symposium (MMS)</btitle><stitle>MMS</stitle><date>2017-11</date><risdate>2017</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><eissn>2157-9830</eissn><eisbn>9781538655757</eisbn><eisbn>1538655756</eisbn><abstract>In this paper, we propose a dual-band six-port based reflectometer designed and implemented using a six-port junction and a four-channel diode detector to measure the reflection coefficient of an unknown load. The proposed reflectometer has been implemented to operate at two frequencies of 1.5 GHz and 2.7 GHz. A linear calibration procedure using five standards has been used to identify the calibration matrix that characterizes the six-port reflectometer. This matrix is used then during measurement to compensate for the reflectometer imperfections and identify the reflection coefficient of the load under test. The experimental results showed that the proposed dual-band reflectometer provides a good accuracy in terms of measurement accuracy compared to the commercial N5230A PNA-L high performance Agilent Network Analyzer with a much lower implementation cost.</abstract><pub>IEEE</pub><doi>10.1109/MMS.2017.8497162</doi><tpages>4</tpages></addata></record> |
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subjects | Calibration Detectors Dual band five standards Junctions Linear calibration Microwave theory and techniques Reflection coefficient Six-port reflectometer |
title | Conception of a Dual-band Six-port Based Reflectometer |
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