Different Approaches for Mathematical Evaluation of Resorption Currents in Nanodielectrics

The main goal of this research is to introduce three different kinds of mathematical methods for evaluation of dielectric resorption. These methods will be applied on dielectric contains filler with nano- dimensions. Dielectrics which contained different amount of nano- filler SiO 2 have been prepar...

Full description

Saved in:
Bibliographic Details
Main Authors: Hornak, J., Trnka, P., Mentlik, V., Michal, O., Totzauer, P.
Format: Conference Proceeding
Language:English
Subjects:
Conferences
Current measurement
Dielectric measurement
Dielectrics
Insulation
Production
Space charge
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 4
container_issue
container_start_page 1
container_title
container_volume
creator Hornak, J.
Trnka, P.
Mentlik, V.
Michal, O.
Totzauer, P.
description The main goal of this research is to introduce three different kinds of mathematical methods for evaluation of dielectric resorption. These methods will be applied on dielectric contains filler with nano- dimensions. Dielectrics which contained different amount of nano- filler SiO 2 have been prepared for this study (0, 0.25, 0.5, 0.75, 1.5 and 3 percent by weight). The process of sample production is described in detail. The average values of resorption currents were investigated by the method of Reduced Resorption Curves (RRCs), by the method of determination of the area over the curve and by the method of tangent determination. Individual methods are described in detail with all mathematical formulas, definitions, and illustrations. Selected methods may be used for evaluation of the behavior of the residual charge in solid insulation.
doi_str_mv 10.1109/ICHVE.2018.8641861
format conference_proceeding
fullrecord <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_8641861</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8641861</ieee_id><sourcerecordid>8641861</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-952fc7b42607fc0363580774b4d0d03b8cec8957be580ef4832cf616a18f8933</originalsourceid><addsrcrecordid>eNotkM9KAzEYxKMgWOq-gF7yAlvzP98ey1ptoSpI8eClZNMvNLLdXZKt4NtbtaeZ-cHMYQi55WzGOavuV_XyfTETjMMMjOJg-AUpKgtcSzCagYFLMhHKqlKCFtekyPmTMcaNYEbKCfl4iCFgwm6k82FIvfN7zDT0iT67cY8HN0bvWrr4cu3x5PuO9oG-Ye7T8JfqY_otZxo7-uK6fhexRT-m6PMNuQquzVicdUo2j4tNvSzXr0-rer4uI7d6LCstgreNEobZ4Jk0UgOzVjVqx3ZMNuDRQ6VtgyeOQYEUPhhuHIcAlZRTcvc_GxFxO6R4cOl7ez5D_gAonVPT</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Different Approaches for Mathematical Evaluation of Resorption Currents in Nanodielectrics</title><source>IEEE Xplore All Conference Series</source><creator>Hornak, J. ; Trnka, P. ; Mentlik, V. ; Michal, O. ; Totzauer, P.</creator><creatorcontrib>Hornak, J. ; Trnka, P. ; Mentlik, V. ; Michal, O. ; Totzauer, P.</creatorcontrib><description>The main goal of this research is to introduce three different kinds of mathematical methods for evaluation of dielectric resorption. These methods will be applied on dielectric contains filler with nano- dimensions. Dielectrics which contained different amount of nano- filler SiO 2 have been prepared for this study (0, 0.25, 0.5, 0.75, 1.5 and 3 percent by weight). The process of sample production is described in detail. The average values of resorption currents were investigated by the method of Reduced Resorption Curves (RRCs), by the method of determination of the area over the curve and by the method of tangent determination. Individual methods are described in detail with all mathematical formulas, definitions, and illustrations. Selected methods may be used for evaluation of the behavior of the residual charge in solid insulation.</description><identifier>EISSN: 2474-3852</identifier><identifier>EISBN: 9781538650868</identifier><identifier>EISBN: 153865086X</identifier><identifier>DOI: 10.1109/ICHVE.2018.8641861</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conferences ; Current measurement ; Dielectric measurement ; Dielectrics ; Insulation ; Production ; Space charge</subject><ispartof>2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE), 2018, p.1-4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8641861$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,27925,54555,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8641861$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Hornak, J.</creatorcontrib><creatorcontrib>Trnka, P.</creatorcontrib><creatorcontrib>Mentlik, V.</creatorcontrib><creatorcontrib>Michal, O.</creatorcontrib><creatorcontrib>Totzauer, P.</creatorcontrib><title>Different Approaches for Mathematical Evaluation of Resorption Currents in Nanodielectrics</title><title>2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE)</title><addtitle>ICHVE</addtitle><description>The main goal of this research is to introduce three different kinds of mathematical methods for evaluation of dielectric resorption. These methods will be applied on dielectric contains filler with nano- dimensions. Dielectrics which contained different amount of nano- filler SiO 2 have been prepared for this study (0, 0.25, 0.5, 0.75, 1.5 and 3 percent by weight). The process of sample production is described in detail. The average values of resorption currents were investigated by the method of Reduced Resorption Curves (RRCs), by the method of determination of the area over the curve and by the method of tangent determination. Individual methods are described in detail with all mathematical formulas, definitions, and illustrations. Selected methods may be used for evaluation of the behavior of the residual charge in solid insulation.</description><subject>Conferences</subject><subject>Current measurement</subject><subject>Dielectric measurement</subject><subject>Dielectrics</subject><subject>Insulation</subject><subject>Production</subject><subject>Space charge</subject><issn>2474-3852</issn><isbn>9781538650868</isbn><isbn>153865086X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2018</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkM9KAzEYxKMgWOq-gF7yAlvzP98ey1ptoSpI8eClZNMvNLLdXZKt4NtbtaeZ-cHMYQi55WzGOavuV_XyfTETjMMMjOJg-AUpKgtcSzCagYFLMhHKqlKCFtekyPmTMcaNYEbKCfl4iCFgwm6k82FIvfN7zDT0iT67cY8HN0bvWrr4cu3x5PuO9oG-Ye7T8JfqY_otZxo7-uK6fhexRT-m6PMNuQquzVicdUo2j4tNvSzXr0-rer4uI7d6LCstgreNEobZ4Jk0UgOzVjVqx3ZMNuDRQ6VtgyeOQYEUPhhuHIcAlZRTcvc_GxFxO6R4cOl7ez5D_gAonVPT</recordid><startdate>201809</startdate><enddate>201809</enddate><creator>Hornak, J.</creator><creator>Trnka, P.</creator><creator>Mentlik, V.</creator><creator>Michal, O.</creator><creator>Totzauer, P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201809</creationdate><title>Different Approaches for Mathematical Evaluation of Resorption Currents in Nanodielectrics</title><author>Hornak, J. ; Trnka, P. ; Mentlik, V. ; Michal, O. ; Totzauer, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-952fc7b42607fc0363580774b4d0d03b8cec8957be580ef4832cf616a18f8933</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Conferences</topic><topic>Current measurement</topic><topic>Dielectric measurement</topic><topic>Dielectrics</topic><topic>Insulation</topic><topic>Production</topic><topic>Space charge</topic><toplevel>online_resources</toplevel><creatorcontrib>Hornak, J.</creatorcontrib><creatorcontrib>Trnka, P.</creatorcontrib><creatorcontrib>Mentlik, V.</creatorcontrib><creatorcontrib>Michal, O.</creatorcontrib><creatorcontrib>Totzauer, P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore (Online service)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hornak, J.</au><au>Trnka, P.</au><au>Mentlik, V.</au><au>Michal, O.</au><au>Totzauer, P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Different Approaches for Mathematical Evaluation of Resorption Currents in Nanodielectrics</atitle><btitle>2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE)</btitle><stitle>ICHVE</stitle><date>2018-09</date><risdate>2018</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><eissn>2474-3852</eissn><eisbn>9781538650868</eisbn><eisbn>153865086X</eisbn><abstract>The main goal of this research is to introduce three different kinds of mathematical methods for evaluation of dielectric resorption. These methods will be applied on dielectric contains filler with nano- dimensions. Dielectrics which contained different amount of nano- filler SiO 2 have been prepared for this study (0, 0.25, 0.5, 0.75, 1.5 and 3 percent by weight). The process of sample production is described in detail. The average values of resorption currents were investigated by the method of Reduced Resorption Curves (RRCs), by the method of determination of the area over the curve and by the method of tangent determination. Individual methods are described in detail with all mathematical formulas, definitions, and illustrations. Selected methods may be used for evaluation of the behavior of the residual charge in solid insulation.</abstract><pub>IEEE</pub><doi>10.1109/ICHVE.2018.8641861</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier EISSN: 2474-3852
ispartof 2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE), 2018, p.1-4
issn 2474-3852
language eng
recordid cdi_ieee_primary_8641861
source IEEE Xplore All Conference Series
subjects Conferences
Current measurement
Dielectric measurement
Dielectrics
Insulation
Production
Space charge
title Different Approaches for Mathematical Evaluation of Resorption Currents in Nanodielectrics
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T17%3A21%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Different%20Approaches%20for%20Mathematical%20Evaluation%20of%20Resorption%20Currents%20in%20Nanodielectrics&rft.btitle=2018%20IEEE%20International%20Conference%20on%20High%20Voltage%20Engineering%20and%20Application%20(ICHVE)&rft.au=Hornak,%20J.&rft.date=2018-09&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.eissn=2474-3852&rft_id=info:doi/10.1109/ICHVE.2018.8641861&rft.eisbn=9781538650868&rft.eisbn_list=153865086X&rft_dat=%3Cieee_CHZPO%3E8641861%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-952fc7b42607fc0363580774b4d0d03b8cec8957be580ef4832cf616a18f8933%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=8641861&rfr_iscdi=true