SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET

This paper proposes soft error immune flip-flop (SEIFF) for mitigating single event upset (SEU) in flip-flops (FFs) and impact of single event transient (SET) in combinational-logic. SEIFF mitigates the SET without enlarging setup-time and delay; there is no overhead in circuit performance. Alpha an...

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Bibliographic Details
Main Authors: Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lee, Seungbae, Pae, Sangwoo
Format: Conference Proceeding
Language:English
Subjects:
alpha
Bars
Delays
FinFETs
mitigation technique
Neutrons
proton
Protons
Radiation effects
single event transient
single event upset
Single event upsets
soft error
Online Access:Request full text
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Description
Summary:This paper proposes soft error immune flip-flop (SEIFF) for mitigating single event upset (SEU) in flip-flops (FFs) and impact of single event transient (SET) in combinational-logic. SEIFF mitigates the SET without enlarging setup-time and delay; there is no overhead in circuit performance. Alpha and proton tests validate the mitigation efficiency in SEIFF manufactured on 10 nm FinFET technology.
ISSN:1938-1891
DOI:10.1109/IRPS.2019.8720513