New Circuit Topology for System-Level Reliability of GaN

To accelerate GaN adoption, beyond-JEDEC system-level reliability should be done to prove the robustness of GaN in applications. In this paper, a new hard switching test vehicle (half-bridge RC load) was proposed & demonstrated to achieve system-like stress, flexibility of acceleration test, low...

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Bibliographic Details
Main Authors: Lin, Ming-Cheng, Chang, Wen-Che, Wu, Haw-Yun, Lansbergen, Gabriel Petrus, Kwan, Man-Ho, Yu, Jiun-Lei, Wu, Cheng-Pao, Tsai, Chun-Lin, Tuan, Hsiao-Chin, Kalnitsky, Alex
Format: Conference Proceeding
Language:English
Subjects:
Acceleration
Gallium nitride
GaN
MTTF
Power demand
Reliability
Stress
Switches
System Lifetime
Vehicle dynamics
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Summary:To accelerate GaN adoption, beyond-JEDEC system-level reliability should be done to prove the robustness of GaN in applications. In this paper, a new hard switching test vehicle (half-bridge RC load) was proposed & demonstrated to achieve system-like stress, flexibility of acceleration test, low system power consumption with large sample size, easy setup & control which can meet system-level reliability requirement.
ISSN:1946-0201
DOI:10.1109/ISPSD.2019.8757683