Special Session: In-System-Test (IST) Architecture for NVIDIA Drive-AGX Platforms

Safety is one of the crucial features of autonomous drive platforms, and semiconductor chips used in these architectures must guarantee functional safety aspects mandated by ISO 26262 standard. To monitor the failures due to field defects, in-system-structural-tests are automatically run during key-...

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Bibliographic Details
Main Authors: Datla Jagannadha, Pavan Kumar, Yilmaz, Mahmut, Sonawane, Milind, Chadalavada, Sailendra, Sarangi, Shantanu, Bhaskaran, Bonita, Bajpai, Shashank, Reddy, Venkat Abilash, Pandey, Jayesh, Jiang, Sam
Format: Conference Proceeding
Language:English
Subjects:
ATPG
automotive
Automotive engineering
Clocks
Computer architecture
functional safety
Graphics processing units
in-system-test
ISO 26262
ISO Standards
LBIST
MBIST
permanent faults
power
Safety
Testing
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Summary:Safety is one of the crucial features of autonomous drive platforms, and semiconductor chips used in these architectures must guarantee functional safety aspects mandated by ISO 26262 standard. To monitor the failures due to field defects, in-system-structural-tests are automatically run during key-on and/or key-off. Upon detection of any permanent defects by the in-system-test (IST) architecture, Drive platform responds to achieve the fail-safe state of the system. In this paper, we present the IST architecture that helps with achieving highest functional safety levels on the NVIDIA Drive platform.
ISSN:2375-1053
DOI:10.1109/VTS.2019.8758636