Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle

Previous work on the Carnegie Mellon Logic Characterization Vehicle (CM-LCV) has achieved optimal testability for static fault models. This work explores enhancements to the CM- LCV that make delay faults optimally testable, with specific focus on the path delay fault model. Results from a design ex...

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Bibliographic Details
Main Authors: Niewenhuis, Ben, Ravikumar, Balaji, Liu, Zeye, Blanton, R. D. Shawn
Format: Conference Proceeding
Language:English
Subjects:
Benchmark testing
Circuit faults
Clocks
Delays
Integrated circuit modeling
Logic testing
Product design
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Description
Summary:Previous work on the Carnegie Mellon Logic Characterization Vehicle (CM-LCV) has achieved optimal testability for static fault models. This work explores enhancements to the CM- LCV that make delay faults optimally testable, with specific focus on the path delay fault model. Results from a design experiment indicate that the modified CM-LCV can achieve up to 100% robust path delay fault coverage, a significant improvement on the estimated 55.22% fault coverage for the reference benchmark design.
ISSN:2375-1053
DOI:10.1109/VTS.2019.8758651