Optimized Algorithm to Reduce the Near-Field Measurement Time on FPGA Device

This paper presents a sequential adaptive sampling algorithm in order to reduce the measurement time of near-field scan. The originality of this approach is to use a deterministic mesh swept according to a sequential progressive adaptive algorithm that defines whether a point must be captured or not...

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Bibliographic Details
Main Authors: Serpaud, Sebastien, Boyer, Alexandre, Dhia, Sonia Ben
Format: Conference Proceeding
Language:English
Subjects:
Adaptive algorithms
adaptive sampling
Electromagnetic compatibility
EMC
emission
Field programmable gate arrays
FPGA
Frequency measurement
Integrated Circuit
Magnetic field measurement
measurement
Near-Field Scanning
NFS
Probes
Time measurement
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Description
Summary:This paper presents a sequential adaptive sampling algorithm in order to reduce the measurement time of near-field scan. The originality of this approach is to use a deterministic mesh swept according to a sequential progressive adaptive algorithm that defines whether a point must be captured or not. All the proposed algorithm parameters are set according to spatial field characteristics and the measurement setup. This approach is validated on the measurement of the magnetic field produced in near-field region by a FPGA device.
ISSN:2575-6893
DOI:10.1109/EMCCompo.2019.8919775