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A method for determining whether asynchronous circuits are self-checking
While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-a...
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| creator | Liebelt, M.J. Cheng-Chew Lim |
| description | While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-at faults have been known for many years, but the restrictions have been such that it has not been feasible to make use of this property to enhance testability. In this paper we demonstrate the feasibility of a technique to determine whether a proposed asynchronous circuit implementation is totally self-checking with respect to all output stuck-at-faults. This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available. |
| doi_str_mv | 10.1109/ATS.2000.893669 |
| format | conference_proceeding |
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This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available.</description><subject>Asynchronous circuits</subject><subject>Automatic testing</subject><subject>Circuit faults</subject><subject>Circuit noise</subject><subject>Circuit testing</subject><subject>Delay</subject><subject>Logic testing</subject><subject>Power engineering and energy</subject><subject>System recovery</subject><subject>System testing</subject><issn>1081-7735</issn><issn>2377-5386</issn><isbn>0769508871</isbn><isbn>9780769508870</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkEtLAzEUhYMPsK2uBVdZuZt6k9vmsSzFFxRcWNdDmrlxovOoyRTpv3egrg4cvnO49zB2K2AuBNiH1fZ9LgFgbiwqZc_YRKLWxRKNOmdT0MouwRgtLthEgBGF1ri8YtOcv8YQgsUJe1nxloa6r3joE69ooNTGLnaf_LcefUrc5WPn69R3_SFzH5M_xCFzl4hnakLha_LfI3_NLoNrMt3864x9PD1u1y_F5u35db3aFFECDgXqoHaBdl4Iobx1krxGuzDW7iyAXBAEo8MCXKiCtoZEJZRErGD8kzR4nLH7U-8-9T8HykPZxuypaVxH44Wl1AqEsHoE705gJKJyn2Lr0rE8LYV_L2pasg</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Liebelt, M.J.</creator><creator>Cheng-Chew Lim</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>2000</creationdate><title>A method for determining whether asynchronous circuits are self-checking</title><author>Liebelt, M.J. ; Cheng-Chew Lim</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i203t-37f6bfebc1116c9a2ec7394899b90024e0f87f40afdf798e1d16233d0200e70c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Asynchronous circuits</topic><topic>Automatic testing</topic><topic>Circuit faults</topic><topic>Circuit noise</topic><topic>Circuit testing</topic><topic>Delay</topic><topic>Logic testing</topic><topic>Power engineering and energy</topic><topic>System recovery</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Liebelt, M.J.</creatorcontrib><creatorcontrib>Cheng-Chew Lim</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Liebelt, M.J.</au><au>Cheng-Chew Lim</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A method for determining whether asynchronous circuits are self-checking</atitle><btitle>Proceedings - Asian Test Symposium</btitle><stitle>ATS</stitle><date>2000</date><risdate>2000</risdate><spage>472</spage><epage>477</epage><pages>472-477</pages><issn>1081-7735</issn><eissn>2377-5386</eissn><isbn>0769508871</isbn><isbn>9780769508870</isbn><abstract>While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-at faults have been known for many years, but the restrictions have been such that it has not been feasible to make use of this property to enhance testability. In this paper we demonstrate the feasibility of a technique to determine whether a proposed asynchronous circuit implementation is totally self-checking with respect to all output stuck-at-faults. This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available.</abstract><pub>IEEE</pub><doi>10.1109/ATS.2000.893669</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1081-7735 |
| ispartof | Proceedings - Asian Test Symposium, 2000, p.472-477 |
| issn | 1081-7735 2377-5386 |
| language | eng |
| recordid | cdi_ieee_primary_893669 |
| source | IEEE Xplore All Conference Series |
| subjects | Asynchronous circuits Automatic testing Circuit faults Circuit noise Circuit testing Delay Logic testing Power engineering and energy System recovery System testing |
| title | A method for determining whether asynchronous circuits are self-checking |
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