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A compendium of recent optocoupler radiation test data
We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients (SET) and degradation due to total ionizing dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.
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| creator | LaBel, K.A. Kniffin, S.D. Reed, R.A. Kim, H.S. Wert, J.L. Oberg, D.L. Normand, E. Johnston, A.H. Lum, G.K. Koga, R. Crain, S. Schwank, J.R. Hash, G.L. Buchner, S. Mann, J. Simpkins, L. D'Ordine, M. Marshall, C.A. O'Bryan, M.V. Seidleck, C.M. Nguyen, L.X. Carts, M.A. Ladbury, R.L. Howard, J.W. |
| description | We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients (SET) and degradation due to total ionizing dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms. |
| doi_str_mv | 10.1109/REDW.2000.896280 |
| format | conference_proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_896280</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>896280</ieee_id><sourcerecordid>896280</sourcerecordid><originalsourceid>FETCH-LOGICAL-i146t-da4871235b300aa188e72ad6a002aad217cece5f5d5d6dad772e63e94c079cbf3</originalsourceid><addsrcrecordid>eNotj8tqwzAURAWl0JJ6X7rSD9i9eliPZUjTBwQKpSHLcCNdg0psGVtZ9O9rSGFgFgfmMIw9CmiEAP_8tX05NBIAGueNdHDDKm8dLFFGW93esWqefxYOyhsQ-p6ZNQ-5H2mI6dLz3PGJAg2F57HkkC_jmSY-YUxYUh54obnwiAUf2G2H55mq_16x_ev2e_Ne7z7fPjbrXZ2ENqWOqJ0VUrUnBYAonCMrMRoEkIhRChsWXdu1sY0mYrRWklHkdQDrw6lTK_Z03U1EdByn1OP0e7yeU3_2SET2</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A compendium of recent optocoupler radiation test data</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>LaBel, K.A. ; Kniffin, S.D. ; Reed, R.A. ; Kim, H.S. ; Wert, J.L. ; Oberg, D.L. ; Normand, E. ; Johnston, A.H. ; Lum, G.K. ; Koga, R. ; Crain, S. ; Schwank, J.R. ; Hash, G.L. ; Buchner, S. ; Mann, J. ; Simpkins, L. ; D'Ordine, M. ; Marshall, C.A. ; O'Bryan, M.V. ; Seidleck, C.M. ; Nguyen, L.X. ; Carts, M.A. ; Ladbury, R.L. ; Howard, J.W.</creator><creatorcontrib>LaBel, K.A. ; Kniffin, S.D. ; Reed, R.A. ; Kim, H.S. ; Wert, J.L. ; Oberg, D.L. ; Normand, E. ; Johnston, A.H. ; Lum, G.K. ; Koga, R. ; Crain, S. ; Schwank, J.R. ; Hash, G.L. ; Buchner, S. ; Mann, J. ; Simpkins, L. ; D'Ordine, M. ; Marshall, C.A. ; O'Bryan, M.V. ; Seidleck, C.M. ; Nguyen, L.X. ; Carts, M.A. ; Ladbury, R.L. ; Howard, J.W.</creatorcontrib><description>We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients (SET) and degradation due to total ionizing dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.</description><identifier>ISBN: 9780780364745</identifier><identifier>ISBN: 0780364740</identifier><identifier>DOI: 10.1109/REDW.2000.896280</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aerospace electronics ; Aerospace engineering ; Aerospace testing ; Degradation ; Ionizing radiation ; Laboratories ; Light emitting diodes ; Neutrons ; Protons ; Space technology</subject><ispartof>2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2000, p.123-146</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/896280$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,4048,4049,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/896280$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>LaBel, K.A.</creatorcontrib><creatorcontrib>Kniffin, S.D.</creatorcontrib><creatorcontrib>Reed, R.A.</creatorcontrib><creatorcontrib>Kim, H.S.</creatorcontrib><creatorcontrib>Wert, J.L.</creatorcontrib><creatorcontrib>Oberg, D.L.</creatorcontrib><creatorcontrib>Normand, E.</creatorcontrib><creatorcontrib>Johnston, A.H.</creatorcontrib><creatorcontrib>Lum, G.K.</creatorcontrib><creatorcontrib>Koga, R.</creatorcontrib><creatorcontrib>Crain, S.</creatorcontrib><creatorcontrib>Schwank, J.R.</creatorcontrib><creatorcontrib>Hash, G.L.</creatorcontrib><creatorcontrib>Buchner, S.</creatorcontrib><creatorcontrib>Mann, J.</creatorcontrib><creatorcontrib>Simpkins, L.</creatorcontrib><creatorcontrib>D'Ordine, M.</creatorcontrib><creatorcontrib>Marshall, C.A.</creatorcontrib><creatorcontrib>O'Bryan, M.V.</creatorcontrib><creatorcontrib>Seidleck, C.M.</creatorcontrib><creatorcontrib>Nguyen, L.X.</creatorcontrib><creatorcontrib>Carts, M.A.</creatorcontrib><creatorcontrib>Ladbury, R.L.</creatorcontrib><creatorcontrib>Howard, J.W.</creatorcontrib><title>A compendium of recent optocoupler radiation test data</title><title>2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)</title><addtitle>REDW</addtitle><description>We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients (SET) and degradation due to total ionizing dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.</description><subject>Aerospace electronics</subject><subject>Aerospace engineering</subject><subject>Aerospace testing</subject><subject>Degradation</subject><subject>Ionizing radiation</subject><subject>Laboratories</subject><subject>Light emitting diodes</subject><subject>Neutrons</subject><subject>Protons</subject><subject>Space technology</subject><isbn>9780780364745</isbn><isbn>0780364740</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj8tqwzAURAWl0JJ6X7rSD9i9eliPZUjTBwQKpSHLcCNdg0psGVtZ9O9rSGFgFgfmMIw9CmiEAP_8tX05NBIAGueNdHDDKm8dLFFGW93esWqefxYOyhsQ-p6ZNQ-5H2mI6dLz3PGJAg2F57HkkC_jmSY-YUxYUh54obnwiAUf2G2H55mq_16x_ev2e_Ne7z7fPjbrXZ2ENqWOqJ0VUrUnBYAonCMrMRoEkIhRChsWXdu1sY0mYrRWklHkdQDrw6lTK_Z03U1EdByn1OP0e7yeU3_2SET2</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>LaBel, K.A.</creator><creator>Kniffin, S.D.</creator><creator>Reed, R.A.</creator><creator>Kim, H.S.</creator><creator>Wert, J.L.</creator><creator>Oberg, D.L.</creator><creator>Normand, E.</creator><creator>Johnston, A.H.</creator><creator>Lum, G.K.</creator><creator>Koga, R.</creator><creator>Crain, S.</creator><creator>Schwank, J.R.</creator><creator>Hash, G.L.</creator><creator>Buchner, S.</creator><creator>Mann, J.</creator><creator>Simpkins, L.</creator><creator>D'Ordine, M.</creator><creator>Marshall, C.A.</creator><creator>O'Bryan, M.V.</creator><creator>Seidleck, C.M.</creator><creator>Nguyen, L.X.</creator><creator>Carts, M.A.</creator><creator>Ladbury, R.L.</creator><creator>Howard, J.W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2000</creationdate><title>A compendium of recent optocoupler radiation test data</title><author>LaBel, K.A. ; Kniffin, S.D. ; Reed, R.A. ; Kim, H.S. ; Wert, J.L. ; Oberg, D.L. ; Normand, E. ; Johnston, A.H. ; Lum, G.K. ; Koga, R. ; Crain, S. ; Schwank, J.R. ; Hash, G.L. ; Buchner, S. ; Mann, J. ; Simpkins, L. ; D'Ordine, M. ; Marshall, C.A. ; O'Bryan, M.V. ; Seidleck, C.M. ; Nguyen, L.X. ; Carts, M.A. ; Ladbury, R.L. ; Howard, J.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i146t-da4871235b300aa188e72ad6a002aad217cece5f5d5d6dad772e63e94c079cbf3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Aerospace electronics</topic><topic>Aerospace engineering</topic><topic>Aerospace testing</topic><topic>Degradation</topic><topic>Ionizing radiation</topic><topic>Laboratories</topic><topic>Light emitting diodes</topic><topic>Neutrons</topic><topic>Protons</topic><topic>Space technology</topic><toplevel>online_resources</toplevel><creatorcontrib>LaBel, K.A.</creatorcontrib><creatorcontrib>Kniffin, S.D.</creatorcontrib><creatorcontrib>Reed, R.A.</creatorcontrib><creatorcontrib>Kim, H.S.</creatorcontrib><creatorcontrib>Wert, J.L.</creatorcontrib><creatorcontrib>Oberg, D.L.</creatorcontrib><creatorcontrib>Normand, E.</creatorcontrib><creatorcontrib>Johnston, A.H.</creatorcontrib><creatorcontrib>Lum, G.K.</creatorcontrib><creatorcontrib>Koga, R.</creatorcontrib><creatorcontrib>Crain, S.</creatorcontrib><creatorcontrib>Schwank, J.R.</creatorcontrib><creatorcontrib>Hash, G.L.</creatorcontrib><creatorcontrib>Buchner, S.</creatorcontrib><creatorcontrib>Mann, J.</creatorcontrib><creatorcontrib>Simpkins, L.</creatorcontrib><creatorcontrib>D'Ordine, M.</creatorcontrib><creatorcontrib>Marshall, C.A.</creatorcontrib><creatorcontrib>O'Bryan, M.V.</creatorcontrib><creatorcontrib>Seidleck, C.M.</creatorcontrib><creatorcontrib>Nguyen, L.X.</creatorcontrib><creatorcontrib>Carts, M.A.</creatorcontrib><creatorcontrib>Ladbury, R.L.</creatorcontrib><creatorcontrib>Howard, J.W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LaBel, K.A.</au><au>Kniffin, S.D.</au><au>Reed, R.A.</au><au>Kim, H.S.</au><au>Wert, J.L.</au><au>Oberg, D.L.</au><au>Normand, E.</au><au>Johnston, A.H.</au><au>Lum, G.K.</au><au>Koga, R.</au><au>Crain, S.</au><au>Schwank, J.R.</au><au>Hash, G.L.</au><au>Buchner, S.</au><au>Mann, J.</au><au>Simpkins, L.</au><au>D'Ordine, M.</au><au>Marshall, C.A.</au><au>O'Bryan, M.V.</au><au>Seidleck, C.M.</au><au>Nguyen, L.X.</au><au>Carts, M.A.</au><au>Ladbury, R.L.</au><au>Howard, J.W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A compendium of recent optocoupler radiation test data</atitle><btitle>2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)</btitle><stitle>REDW</stitle><date>2000</date><risdate>2000</risdate><spage>123</spage><epage>146</epage><pages>123-146</pages><isbn>9780780364745</isbn><isbn>0780364740</isbn><abstract>We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients (SET) and degradation due to total ionizing dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.</abstract><pub>IEEE</pub><doi>10.1109/REDW.2000.896280</doi><tpages>24</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 9780780364745 |
| ispartof | 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2000, p.123-146 |
| issn | |
| language | eng |
| recordid | cdi_ieee_primary_896280 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Aerospace electronics Aerospace engineering Aerospace testing Degradation Ionizing radiation Laboratories Light emitting diodes Neutrons Protons Space technology |
| title | A compendium of recent optocoupler radiation test data |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T03%3A04%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20compendium%20of%20recent%20optocoupler%20radiation%20test%20data&rft.btitle=2000%20IEEE%20Radiation%20Effects%20Data%20Workshop.%20Workshop%20Record.%20Held%20in%20conjunction%20with%20IEEE%20Nuclear%20and%20Space%20Radiation%20Effects%20Conference%20(Cat.%20No.00TH8527)&rft.au=LaBel,%20K.A.&rft.date=2000&rft.spage=123&rft.epage=146&rft.pages=123-146&rft.isbn=9780780364745&rft.isbn_list=0780364740&rft_id=info:doi/10.1109/REDW.2000.896280&rft_dat=%3Cieee_6IE%3E896280%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i146t-da4871235b300aa188e72ad6a002aad217cece5f5d5d6dad772e63e94c079cbf3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=896280&rfr_iscdi=true |