Ultralow-Loss Substrate-Integrated Waveguides in Glass-Based Substrates for Millimeter-Wave Applications

This letter, for the first time, presents low-loss substrate-integrated waveguides (SIWs) in fused silica and borosilicate glass and a comparison of their performance with various organic-based low-loss substrates for millimeter-wave applications. Utilizing ring resonators designed for frequencies i...

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Bibliographic Details
Published in:IEEE transactions on components, packaging, and manufacturing technology (2011) packaging, and manufacturing technology (2011), 2020-03, Vol.10 (3), p.531-533
Main Authors: Watanabe, Atom O., Tehrani, Bijan K., Ogawa, Tomonori, Raj, Pulugurtha Markondeya, Tentzeris, Manos M., Tummala, Rao R.
Format: Article
Language:English
Subjects:
Borosilicate glass
Computer simulation
Conductors
Coplanar waveguides
Correlation analysis
Dielectric measurement
Dielectrics
Electromagnetic waveguides
Frequencies
Fused silica
Glass
Glass substrates
Insertion loss
low loss
millimeter wave (mm-wave)
Millimeter waves
packaging
Silica glass
Silicon compounds
Silicon dioxide
Substrate integrated waveguides
Substrates
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Summary:This letter, for the first time, presents low-loss substrate-integrated waveguides (SIWs) in fused silica and borosilicate glass and a comparison of their performance with various organic-based low-loss substrates for millimeter-wave applications. Utilizing ring resonators designed for frequencies in the 5G New Radio (NR) n257 band (26.5-29.5 GHz), this letter begins with the determination of the dielectric constant of fused silica to model SIWs. This letter also introduces the designs of SIWs that are fed by conductor-backed coplanar waveguides and discusses the fabrication and measurement results with deembedding analysis. In addition to the excellent correlation between simulations and measurements, the characterization results show more than 2× reduction in the insertion loss compared to those of low-loss organic-based SIWs at the 28-GHz frequency band.
ISSN:2156-3950
2156-3985
DOI:10.1109/TCPMT.2020.2968305