Wafer-to-Order Allocation in Semiconductor Back-End Production

This paper discusses the development of an efficient algorithm that minimizes overproduction in the allocation of wafers to customer orders prior to assembly at a semiconductor production facility. This study is motivated by and tested at Nexperia's assembly and test facilities, but its potenti...

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Bibliographic Details
Main Authors: Deenen, Patrick C., Adan, Jelle, Stokkermans, Joep, Adan, Ivo J.B.F., Akcay, Alp
Format: Conference Proceeding
Language:English
Subjects:
Benchmark testing
Electronics industry
Heuristic algorithms
Integrated circuits
Resource management
Semiconductor device modeling
Test facilities
Online Access:Request full text
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Summary:This paper discusses the development of an efficient algorithm that minimizes overproduction in the allocation of wafers to customer orders prior to assembly at a semiconductor production facility. This study is motivated by and tested at Nexperia's assembly and test facilities, but its potential applications extend to many manufacturers in the semiconductor industry. Inspired by the classic bin covering problem, the wafer allocation problem is formulated as an integer linear program (ILP). A novel heuristic is proposed, referred to as the multi-start swap algorithm, which is compared to current practice, other existing heuristics and benchmarked with a commercial optimization solver. Experiments with real-world data sets show that the proposed solution method significantly outperforms current practice and other existing heuristics, and that the overall performance is generally close to optimal. Furthermore, some data processing steps and heuristics are presented to make the ILP applicable to real-world applications.
ISSN:1558-4305
DOI:10.1109/WSC40007.2019.9004863