Direct observation of local conductive path in degraded multi-layered ceramic capacitor

Local conductive paths have been visualized, in the cross section near a degraded area of multi-layered ceramic capacitor (MLCC) just before dielectric breakdown, by scanning spreading resistance microscopy (SSRM). We have revealed that the degraded area is limited within a specific area of a dielec...

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Bibliographic Details
Main Authors: Izawa, Kazuyoshi, Sada, Takao, Utsunomiya, Masashi, Inayama, Shingo, Fujikawa, Nobuyoshi, Matsubara, Kiyoshi, Yasukawa, Katsumasa
Format: Conference Proceeding
Language:English
Subjects:
Anodes
Cathodes
Degradation
Dielectric
Dielectrics
Ions
MLCC
Resistance
SSRM
visualization
Online Access:Request full text
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Summary:Local conductive paths have been visualized, in the cross section near a degraded area of multi-layered ceramic capacitor (MLCC) just before dielectric breakdown, by scanning spreading resistance microscopy (SSRM). We have revealed that the degraded area is limited within a specific area of a dielectric layer. The insulation resistance (IR) around the cathode was lower than that at the area closer to the anode. We have also done a numerical simulation on conductive path formation with the basis of a physical model. By these observations, we have suggested that the degradation of resistance proceeded from the cathode to the anode side.
ISSN:2375-0448
DOI:10.1109/ISAF43169.2019.9034950