A Novel Single Event Upset Tolerant 12T Memory Cell for Aerospace Applications

This paper proposes a novel 12T radiationhardened memory cell (RHMC-12T) for aerospace application. The proposed design consists of quad-nodes, which stores the data. The architecture consists of only two sensitive nodes, which reduces the total sensitive area compared to the existing radiationharde...

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Bibliographic Details
Main Authors: Dohar, Suraj, Siddharth, R. K., Vasantha, M. H., Kumar Y. B., Nithin
Format: Conference Proceeding
Language:English
Subjects:
Computer architecture
leakage power
Microprocessors
MOSFET
N-curve metrics
Radiation-hardened designs
single event upset (SEU)
Single event upsets
SRAM cells
static noise margin (SNM)
Transient analysis
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Summary:This paper proposes a novel 12T radiationhardened memory cell (RHMC-12T) for aerospace application. The proposed design consists of quad-nodes, which stores the data. The architecture consists of only two sensitive nodes, which reduces the total sensitive area compared to the existing radiationhardened memory cells. It can tolerate both "1" to "0" and "0" to "1" upset at any of the sensitive nodes. The proposed architecture is designed in 65-nm CMOS technology at a supply voltage of 1.2 V. The read and write access times of the proposed design are 80.81 ps and 70.19 ps respectively.
ISSN:2159-3477
DOI:10.1109/ISVLSI49217.2020.00019