A microwave broadband technique to measure the complex resistivity of HTS thin films

We propose a new broadband swept frequency technique to measure the complex resistivity of high T/sub c/ superconducting thin films in the microwave range (from a few GHz up to 50 GHz). A coaxial cable connects the sample to a vector network analyzer which performs reflection measurements; the film...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.3082-3085
Main Authors: Tosoratti, N., Fastampa, R., Giura, M., Lenzi, V., Sarti, S., Silva, E.
Format: Article
Language:English
Subjects:
Broadband
Coaxial cables
Coaxial components
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Conductivity
Contact
CONTACTS
COPPER OXIDE
Electric contacts
ELECTRICAL CONDUCTIVITY
Electrical resistivity
Electromagnetic measurements
Exact sciences and technology
Frequency measurement
High-tc films
Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
MATHEMATICAL ANALYSIS
MEASUREMENT
Microwave measurements
Microwave theory and techniques
MICROWAVES
Performance analysis
Physics
Properties of type I and type II superconductors
Superconducting films and low-dimensional structures
Superconducting thin films
SUPERCONDUCTIVITY
THIN FILMS
Transport properties (electric and thermal conductivity, thermoelectric effects, etc.)
YTTRIUM OXIDE
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Description
Summary:We propose a new broadband swept frequency technique to measure the complex resistivity of high T/sub c/ superconducting thin films in the microwave range (from a few GHz up to 50 GHz). A coaxial cable connects the sample to a vector network analyzer which performs reflection measurements; the film and the coaxial end are separated by a short section of circular waveguide. The absence of direct electrical contact between the sample and the coaxial core simplifies realization and avoids contact instability with large temperature variations. We provide an electromagnetic analysis of the coaxial to cylindrical transition (CCT) and find a closed form relation between the measured quantities and the film resistivity. Finally, we present some experimental results obtained for an YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin film using the described method.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.919714