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High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials

Tomographic microwave imaging is employed in numerous industrial applications, e.g., nondestructive testing. However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79...

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Main Authors: Och, Andreas, Holzl, Patrick A., Schuster, Stefan, Schrattenecker, Jochen O., Freidl, Philipp F., Scheiblhofer, Stefan, Zankl, Dominik, Pathuri-Bhuvana, Venkata, Weigel, Robert
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creator Och, Andreas
Holzl, Patrick A.
Schuster, Stefan
Schrattenecker, Jochen O.
Freidl, Philipp F.
Scheiblhofer, Stefan
Zankl, Dominik
Pathuri-Bhuvana, Venkata
Weigel, Robert
description Tomographic microwave imaging is employed in numerous industrial applications, e.g., nondestructive testing. However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79 GHz high-resolution tomography system enabling characterization of materials with relative permittivity close to one. It is based on fully-integrated frequency-modulated continuous-wave radar transceivers which significantly reduce cost and complexity. A first prototype is built with two radar sensors and a rotary stage to emulate a higher sensor count. The medium-dependent time-of-flight through the area-under-test is evaluated and Tikhonov regularization is applied to solve the inverse problem and reconstruct a 2D image. System simulations and measurements with low-permittivity foam objects confirm the feasibility of this approach.
doi_str_mv 10.1109/IMS30576.2020.9224048
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source IEEE Xplore All Conference Series
subjects Millimeter wave radar
nondestructive testing
permittivity
Permittivity measurement
Prototypes
Radar antennas
Radar imaging
Sensor phenomena and characterization
time of arrival estimation
Tomography
title High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials
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