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High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials
Tomographic microwave imaging is employed in numerous industrial applications, e.g., nondestructive testing. However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79...
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creator | Och, Andreas Holzl, Patrick A. Schuster, Stefan Schrattenecker, Jochen O. Freidl, Philipp F. Scheiblhofer, Stefan Zankl, Dominik Pathuri-Bhuvana, Venkata Weigel, Robert |
description | Tomographic microwave imaging is employed in numerous industrial applications, e.g., nondestructive testing. However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79 GHz high-resolution tomography system enabling characterization of materials with relative permittivity close to one. It is based on fully-integrated frequency-modulated continuous-wave radar transceivers which significantly reduce cost and complexity. A first prototype is built with two radar sensors and a rotary stage to emulate a higher sensor count. The medium-dependent time-of-flight through the area-under-test is evaluated and Tikhonov regularization is applied to solve the inverse problem and reconstruct a 2D image. System simulations and measurements with low-permittivity foam objects confirm the feasibility of this approach. |
doi_str_mv | 10.1109/IMS30576.2020.9224048 |
format | conference_proceeding |
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However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79 GHz high-resolution tomography system enabling characterization of materials with relative permittivity close to one. It is based on fully-integrated frequency-modulated continuous-wave radar transceivers which significantly reduce cost and complexity. A first prototype is built with two radar sensors and a rotary stage to emulate a higher sensor count. The medium-dependent time-of-flight through the area-under-test is evaluated and Tikhonov regularization is applied to solve the inverse problem and reconstruct a 2D image. System simulations and measurements with low-permittivity foam objects confirm the feasibility of this approach.</description><subject>Millimeter wave radar</subject><subject>nondestructive testing</subject><subject>permittivity</subject><subject>Permittivity measurement</subject><subject>Prototypes</subject><subject>Radar antennas</subject><subject>Radar imaging</subject><subject>Sensor phenomena and characterization</subject><subject>time of arrival estimation</subject><subject>Tomography</subject><issn>2576-7216</issn><isbn>9781728168159</isbn><isbn>1728168155</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2020</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkM1Kw0AUhUdBsNY-gQjzAlPv_GZmKUVtoUWxFZdlkty0I4lTklGJT2_Urr7F-c5ZHEKuOUw5B3ezWK0l6MxMBQiYOiEUKHtCJi6zPBOWG8u1OyUjMTgsE9yck4uuewMAPYQjUs7Dbs-esYv1Rwrxna5CXYcGE7bs1X8i3cQm7lp_2Pd03XcJG1rFls72vvXFIIVv_1eLFV3GL_aEbRNSCp8h9XTlfwVfd5fkrBqAkyPH5OX-bjObs-Xjw2J2u2RBgExMA5pcolR54UwGQpcuV5XC3JbGSguqcoUsTF5omZUcSiMRdI6VtRqUME6OydX_bkDE7aENjW_77fEU-QOPRVgz</recordid><startdate>202008</startdate><enddate>202008</enddate><creator>Och, Andreas</creator><creator>Holzl, Patrick A.</creator><creator>Schuster, Stefan</creator><creator>Schrattenecker, Jochen O.</creator><creator>Freidl, Philipp F.</creator><creator>Scheiblhofer, Stefan</creator><creator>Zankl, Dominik</creator><creator>Pathuri-Bhuvana, Venkata</creator><creator>Weigel, Robert</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>202008</creationdate><title>High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials</title><author>Och, Andreas ; Holzl, Patrick A. ; Schuster, Stefan ; Schrattenecker, Jochen O. ; Freidl, Philipp F. ; Scheiblhofer, Stefan ; Zankl, Dominik ; Pathuri-Bhuvana, Venkata ; Weigel, Robert</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i203t-50e6b3e34bc967025d9b4f4eb8d683804f9c3c6bc537d10d63e05bef885042693</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Millimeter wave radar</topic><topic>nondestructive testing</topic><topic>permittivity</topic><topic>Permittivity measurement</topic><topic>Prototypes</topic><topic>Radar antennas</topic><topic>Radar imaging</topic><topic>Sensor phenomena and characterization</topic><topic>time of arrival estimation</topic><topic>Tomography</topic><toplevel>online_resources</toplevel><creatorcontrib>Och, Andreas</creatorcontrib><creatorcontrib>Holzl, Patrick A.</creatorcontrib><creatorcontrib>Schuster, Stefan</creatorcontrib><creatorcontrib>Schrattenecker, Jochen O.</creatorcontrib><creatorcontrib>Freidl, Philipp F.</creatorcontrib><creatorcontrib>Scheiblhofer, Stefan</creatorcontrib><creatorcontrib>Zankl, Dominik</creatorcontrib><creatorcontrib>Pathuri-Bhuvana, Venkata</creatorcontrib><creatorcontrib>Weigel, Robert</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Och, Andreas</au><au>Holzl, Patrick A.</au><au>Schuster, Stefan</au><au>Schrattenecker, Jochen O.</au><au>Freidl, Philipp F.</au><au>Scheiblhofer, Stefan</au><au>Zankl, Dominik</au><au>Pathuri-Bhuvana, Venkata</au><au>Weigel, Robert</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials</atitle><btitle>2020 IEEE/MTT-S International Microwave Symposium (IMS)</btitle><stitle>IMS</stitle><date>2020-08</date><risdate>2020</risdate><spage>365</spage><epage>368</epage><pages>365-368</pages><eissn>2576-7216</eissn><eisbn>9781728168159</eisbn><eisbn>1728168155</eisbn><abstract>Tomographic microwave imaging is employed in numerous industrial applications, e.g., nondestructive testing. However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79 GHz high-resolution tomography system enabling characterization of materials with relative permittivity close to one. It is based on fully-integrated frequency-modulated continuous-wave radar transceivers which significantly reduce cost and complexity. A first prototype is built with two radar sensors and a rotary stage to emulate a higher sensor count. The medium-dependent time-of-flight through the area-under-test is evaluated and Tikhonov regularization is applied to solve the inverse problem and reconstruct a 2D image. System simulations and measurements with low-permittivity foam objects confirm the feasibility of this approach.</abstract><pub>IEEE</pub><doi>10.1109/IMS30576.2020.9224048</doi><tpages>4</tpages></addata></record> |
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source | IEEE Xplore All Conference Series |
subjects | Millimeter wave radar nondestructive testing permittivity Permittivity measurement Prototypes Radar antennas Radar imaging Sensor phenomena and characterization time of arrival estimation Tomography |
title | High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials |
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