Empirical comparison of software-based error detection and correction techniques for embedded systems

"Function Tokens" and "NOP Fills" are two methods proposed by various authors to deal with Instruction Pointer corruption in microcontrollers, especially in the presence of high electromagnetic interference levels. An empirical analysis to assess and compare these two techniques...

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Bibliographic Details
Main Authors: Ong, Royan H. L., Pont, Michael J.
Format: Conference Proceeding
Language:English
Subjects:
Application software
Automotive engineering
Computing methodologies > Modeling and simulation > Model development and analysis
Consumer electronics
Electrical equipment industry
Electromagnetic interference
Embedded system
Error correction
Microcontrollers
Power system reliability
Software and its engineering > Software creation and management > Designing software
Software and its engineering > Software organization and properties > Contextual software domains > Operating systems
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Summary:"Function Tokens" and "NOP Fills" are two methods proposed by various authors to deal with Instruction Pointer corruption in microcontrollers, especially in the presence of high electromagnetic interference levels. An empirical analysis to assess and compare these two techniques is presented in this paper. Two main conclusions are drawn: [1] NOP Fills are a powerful technique for improving the reliability of embedded applications in the presence of EMI, and [2] the use of Function Tokens can lead to a reduction in overall system reliability.
DOI:10.1145/371636.371739