Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution

Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the convent...

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Bibliographic Details
Published in:IEEE photonics journal 2021-02, Vol.13 (1), p.1-9
Main Authors: Kong, Weijie, Wang, Changtao, Pu, Mingbo, Ma, Xiaoliang, Li, Xiong, Luo, Xiangang
Format: Article
Language:English
Subjects:
Field of view
Fluorescence
Fluorescence microscopy
Fluoroscopic imaging
Illumination
Image resolution
Imaging
Imaging techniques
Interference fringes
Lighting
Microscopes
Microscopy
Optical imaging
Optical microscopy
Optical surface waves
Photonic crystals
Spatial resolution
Subwavelength structures
Surface waves
Wave diffraction
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Summary:Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility.
ISSN:1943-0655
1943-0655
1943-0647
DOI:10.1109/JPHOT.2020.3044920