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A fast method for identifying matching-relevant transistor pairs

This paper presents a new method to identify mismatch-relevant transistor pairs at the circuit level. It consists in a two-stage selection process that is derived from a sensitivity-based formulation of matching relevancy and is thus very fast. The presented results show the efficiency and effective...

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Bibliographic Details
Main Authors: Eschenkel, F., Pronath, M., Graeb, H., Antreich, K.
Format: Conference Proceeding
Language:English
Subjects:
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Summary:This paper presents a new method to identify mismatch-relevant transistor pairs at the circuit level. It consists in a two-stage selection process that is derived from a sensitivity-based formulation of matching relevancy and is thus very fast. The presented results show the efficiency and effectiveness of the method.
DOI:10.1109/CICC.2001.929802