Mapping the ultrafast charge transfer in van der Waals heterostructures

We employ THz near-field microscopy to investigate ultrafast interlayer charge transfer in van der Waals heterostructures (HS) by tracing the resulting THz emission on the nanoscale. We further employ a novel concept of contact-free tunneling microscopy to monitor the interlayer electron-hole (e-h)...

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Bibliographic Details
Main Authors: Plankl, Markus, Zizlsperger, Martin, Moosharmmer, Fabian, Schiegl, Felix, Sandner, Fabian, Siday, Thomas, Huber, Markus A., Boland, Jessica L., Cocker, Tyler L., Huber, Rupert
Format: Conference Proceeding
Language:English
Subjects:
Charge transfer
Electron microscopy
Nanoscale devices
Sociology
Spatial resolution
Statistics
Tunneling
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Summary:We employ THz near-field microscopy to investigate ultrafast interlayer charge transfer in van der Waals heterostructures (HS) by tracing the resulting THz emission on the nanoscale. We further employ a novel concept of contact-free tunneling microscopy to monitor the interlayer electron-hole (e-h) pair population through its build up and decay, providing access to the ultrafast carrier dynamics with spatial resolution orders of magnitude better than the diffraction limit.
ISSN:2162-2035
DOI:10.1109/IRMMW-THz46771.2020.9370645