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Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection
Accurate prediction of device aging plays a vital role in the circuit design of advanced-node CMOS technologies. In particular, hot-carrier induced aging is so complicated that its modeling is often significantly simplified, with focus limited to digital circuits. We present here a novel reliability...
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| creator | Vyas, Pratik B. Pimparkar, Ninad Tu, Robert Arfaoui, Wafa Bossu, Germain Siddabathula, Mahesh Lehmann, Steffen Goo, Jung-Suk Icel, Ali B. |
| description | Accurate prediction of device aging plays a vital role in the circuit design of advanced-node CMOS technologies. In particular, hot-carrier induced aging is so complicated that its modeling is often significantly simplified, with focus limited to digital circuits. We present here a novel reliability-aware compact modeling method that can accurately capture the full post-stress I-V characteristics of the MOSFET, taking into account the impact of drain depletion region on induced defects. |
| doi_str_mv | 10.1109/IRPS46558.2021.9405197 |
| format | conference_proceeding |
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In particular, hot-carrier induced aging is so complicated that its modeling is often significantly simplified, with focus limited to digital circuits. We present here a novel reliability-aware compact modeling method that can accurately capture the full post-stress I-V characteristics of the MOSFET, taking into account the impact of drain depletion region on induced defects.</abstract><pub>IEEE</pub><doi>10.1109/IRPS46558.2021.9405197</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | EISSN: 1938-1891 |
| ispartof | 2021 IEEE International Reliability Physics Symposium (IRPS), 2021, p.1-4 |
| issn | 1938-1891 |
| language | eng |
| recordid | cdi_ieee_primary_9405197 |
| source | IEEE Xplore All Conference Series |
| subjects | Aging aging simulation CMOS Data models defects HCI hot carrier degradation Integrated circuit modeling Integrated circuit reliability MOSFET Reliability Robustness Semiconductor device modeling SPICE model |
| title | Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection |
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