Evaluation of Commercial Connectors for Active Neural Implants

Multichannel connectors enable part-replacement of implanted active neural interfaces. For pre-clinical investigation, commercially available miniature connectors enable high channel counts with reduced size and cost. In this paper, Omnetics Nano Circular connectors were encapsulated with medical gr...

Full description

Saved in:
Bibliographic Details
Main Authors: Lancashire, Henry T., Habibollahi, Maryam, Jiang, Dai, Demosthenous, Andreas
Format: Conference Proceeding
Language:English
Subjects:
Connectors
Inspection
Loading
Moisture
Neural engineering
Neural implants
Surgery
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 976
container_issue
container_start_page 973
container_title
container_volume
creator Lancashire, Henry T.
Habibollahi, Maryam
Jiang, Dai
Demosthenous, Andreas
description Multichannel connectors enable part-replacement of implanted active neural interfaces. For pre-clinical investigation, commercially available miniature connectors enable high channel counts with reduced size and cost. In this paper, Omnetics Nano Circular connectors were encapsulated with medical grade silicone, and assembled using an approach proposed used in surgery. Three 11-pin connectors were tested in PBS for 336 days with cyclic loading for a total of 66 days. A single connector failed with current leakage between channels due to moisture at the connecting interface, and with corrosion at 3 solder joints. The surviving connectors maintained a low contact impedance and high between-channel impedance over 336 days. Inspection of the failed sample emphasizes the need for stress relief near implanted connectors and void-free encapsulation.
doi_str_mv 10.1109/NER49283.2021.9441072
format conference_proceeding
fullrecord <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_9441072</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9441072</ieee_id><sourcerecordid>9441072</sourcerecordid><originalsourceid>FETCH-LOGICAL-i250t-d1c87b97d1d851e7a99bd74129739afa512d57861339f0f9f2a557cdb468103b3</originalsourceid><addsrcrecordid>eNotj9tKw0AURUdBsNR8gQj5gcRz5tKZ8yKUELVQKkj7XCaZGRjJpUzSgn9vwT7tBQsWbMZeEEpEoNdd_S2JG1Fy4FiSlAia37GMtEHNDUohtLlnCyRpCqGUfGTZNP0AgOAgkcyCvdUX253tHMchH0NejX3vUxttd8Vh8O08pikPY8rX7RwvPt_5c7rKTX_q7DBPT-wh2G7y2W2X7PBe76vPYvv1sanW2yJyBXPhsDW6Ie3QGYVeW6LGaYmctCAbrELulDYrFIICBArcKqVb18iVQRCNWLLn_2703h9PKfY2_R5vj8Ufhv9JkQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Evaluation of Commercial Connectors for Active Neural Implants</title><source>IEEE Xplore All Conference Series</source><creator>Lancashire, Henry T. ; Habibollahi, Maryam ; Jiang, Dai ; Demosthenous, Andreas</creator><creatorcontrib>Lancashire, Henry T. ; Habibollahi, Maryam ; Jiang, Dai ; Demosthenous, Andreas</creatorcontrib><description>Multichannel connectors enable part-replacement of implanted active neural interfaces. For pre-clinical investigation, commercially available miniature connectors enable high channel counts with reduced size and cost. In this paper, Omnetics Nano Circular connectors were encapsulated with medical grade silicone, and assembled using an approach proposed used in surgery. Three 11-pin connectors were tested in PBS for 336 days with cyclic loading for a total of 66 days. A single connector failed with current leakage between channels due to moisture at the connecting interface, and with corrosion at 3 solder joints. The surviving connectors maintained a low contact impedance and high between-channel impedance over 336 days. Inspection of the failed sample emphasizes the need for stress relief near implanted connectors and void-free encapsulation.</description><identifier>EISSN: 1948-3554</identifier><identifier>EISBN: 9781728143378</identifier><identifier>EISBN: 1728143373</identifier><identifier>DOI: 10.1109/NER49283.2021.9441072</identifier><language>eng</language><publisher>IEEE</publisher><subject>Connectors ; Inspection ; Loading ; Moisture ; Neural engineering ; Neural implants ; Surgery</subject><ispartof>2021 10th International IEEE/EMBS Conference on Neural Engineering (NER), 2021, p.973-976</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9441072$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,27904,54533,54910</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9441072$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lancashire, Henry T.</creatorcontrib><creatorcontrib>Habibollahi, Maryam</creatorcontrib><creatorcontrib>Jiang, Dai</creatorcontrib><creatorcontrib>Demosthenous, Andreas</creatorcontrib><title>Evaluation of Commercial Connectors for Active Neural Implants</title><title>2021 10th International IEEE/EMBS Conference on Neural Engineering (NER)</title><addtitle>NER</addtitle><description>Multichannel connectors enable part-replacement of implanted active neural interfaces. For pre-clinical investigation, commercially available miniature connectors enable high channel counts with reduced size and cost. In this paper, Omnetics Nano Circular connectors were encapsulated with medical grade silicone, and assembled using an approach proposed used in surgery. Three 11-pin connectors were tested in PBS for 336 days with cyclic loading for a total of 66 days. A single connector failed with current leakage between channels due to moisture at the connecting interface, and with corrosion at 3 solder joints. The surviving connectors maintained a low contact impedance and high between-channel impedance over 336 days. Inspection of the failed sample emphasizes the need for stress relief near implanted connectors and void-free encapsulation.</description><subject>Connectors</subject><subject>Inspection</subject><subject>Loading</subject><subject>Moisture</subject><subject>Neural engineering</subject><subject>Neural implants</subject><subject>Surgery</subject><issn>1948-3554</issn><isbn>9781728143378</isbn><isbn>1728143373</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2021</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj9tKw0AURUdBsNR8gQj5gcRz5tKZ8yKUELVQKkj7XCaZGRjJpUzSgn9vwT7tBQsWbMZeEEpEoNdd_S2JG1Fy4FiSlAia37GMtEHNDUohtLlnCyRpCqGUfGTZNP0AgOAgkcyCvdUX253tHMchH0NejX3vUxttd8Vh8O08pikPY8rX7RwvPt_5c7rKTX_q7DBPT-wh2G7y2W2X7PBe76vPYvv1sanW2yJyBXPhsDW6Ie3QGYVeW6LGaYmctCAbrELulDYrFIICBArcKqVb18iVQRCNWLLn_2703h9PKfY2_R5vj8Ufhv9JkQ</recordid><startdate>20210504</startdate><enddate>20210504</enddate><creator>Lancashire, Henry T.</creator><creator>Habibollahi, Maryam</creator><creator>Jiang, Dai</creator><creator>Demosthenous, Andreas</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>20210504</creationdate><title>Evaluation of Commercial Connectors for Active Neural Implants</title><author>Lancashire, Henry T. ; Habibollahi, Maryam ; Jiang, Dai ; Demosthenous, Andreas</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i250t-d1c87b97d1d851e7a99bd74129739afa512d57861339f0f9f2a557cdb468103b3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Connectors</topic><topic>Inspection</topic><topic>Loading</topic><topic>Moisture</topic><topic>Neural engineering</topic><topic>Neural implants</topic><topic>Surgery</topic><toplevel>online_resources</toplevel><creatorcontrib>Lancashire, Henry T.</creatorcontrib><creatorcontrib>Habibollahi, Maryam</creatorcontrib><creatorcontrib>Jiang, Dai</creatorcontrib><creatorcontrib>Demosthenous, Andreas</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lancashire, Henry T.</au><au>Habibollahi, Maryam</au><au>Jiang, Dai</au><au>Demosthenous, Andreas</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Evaluation of Commercial Connectors for Active Neural Implants</atitle><btitle>2021 10th International IEEE/EMBS Conference on Neural Engineering (NER)</btitle><stitle>NER</stitle><date>2021-05-04</date><risdate>2021</risdate><spage>973</spage><epage>976</epage><pages>973-976</pages><eissn>1948-3554</eissn><eisbn>9781728143378</eisbn><eisbn>1728143373</eisbn><abstract>Multichannel connectors enable part-replacement of implanted active neural interfaces. For pre-clinical investigation, commercially available miniature connectors enable high channel counts with reduced size and cost. In this paper, Omnetics Nano Circular connectors were encapsulated with medical grade silicone, and assembled using an approach proposed used in surgery. Three 11-pin connectors were tested in PBS for 336 days with cyclic loading for a total of 66 days. A single connector failed with current leakage between channels due to moisture at the connecting interface, and with corrosion at 3 solder joints. The surviving connectors maintained a low contact impedance and high between-channel impedance over 336 days. Inspection of the failed sample emphasizes the need for stress relief near implanted connectors and void-free encapsulation.</abstract><pub>IEEE</pub><doi>10.1109/NER49283.2021.9441072</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier EISSN: 1948-3554
ispartof 2021 10th International IEEE/EMBS Conference on Neural Engineering (NER), 2021, p.973-976
issn 1948-3554
language eng
recordid cdi_ieee_primary_9441072
source IEEE Xplore All Conference Series
subjects Connectors
Inspection
Loading
Moisture
Neural engineering
Neural implants
Surgery
title Evaluation of Commercial Connectors for Active Neural Implants
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T15%3A55%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Evaluation%20of%20Commercial%20Connectors%20for%20Active%20Neural%20Implants&rft.btitle=2021%2010th%20International%20IEEE/EMBS%20Conference%20on%20Neural%20Engineering%20(NER)&rft.au=Lancashire,%20Henry%20T.&rft.date=2021-05-04&rft.spage=973&rft.epage=976&rft.pages=973-976&rft.eissn=1948-3554&rft_id=info:doi/10.1109/NER49283.2021.9441072&rft.eisbn=9781728143378&rft.eisbn_list=1728143373&rft_dat=%3Cieee_CHZPO%3E9441072%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i250t-d1c87b97d1d851e7a99bd74129739afa512d57861339f0f9f2a557cdb468103b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=9441072&rfr_iscdi=true