Extraction of Complex Permittivity of Dielectrics on Package from W-band to D-band

In this paper, a simple method of extracting dielectric material is proposed and copper surface roughness is taken into consideration. The measured results from W-band to D-band are shown to verify the proposed method of extracting complex permittivity of dielectrics. Besides, to validate the propos...

Full description

Saved in:
Bibliographic Details
Main Authors: Lin, Yi-Ting, Kuo, Hung-Chun, Wu, Po-I, Jhong, Ming-Fong, Pan, Po-Chih, Liu, Chung-Yuan, Wang, Chen-Chao, Wu, Tzong-Lin
Format: Conference Proceeding
Language:English
Subjects:
Calibration
complex permittivity
D band
Dielectric constant
Dielectric loss measurement
dielectric loss tangent
dielectric-material measurements
packaging material
Permittivity measurement
Power transmission lines
Surface roughness
Transmission line measurements
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this paper, a simple method of extracting dielectric material is proposed and copper surface roughness is taken into consideration. The measured results from W-band to D-band are shown to verify the proposed method of extracting complex permittivity of dielectrics. Besides, to validate the proposed transmission line technique, the full sets of complex S-parameters with an appropriate "through-reflect-line" (TRL) calibration pattern are measured as well. It also allows accurate determination of the dielectric constant and loss of thin sheet substrate materials. A great consistency between transmission line technique without calibration and TRL calibration method represents that systematic errors are small. In addition, different samples within the same set of packaging are measured and used to extract dielectric constant and loss tangent, which agree well with each other.
ISSN:2377-5726
DOI:10.1109/ECTC32696.2021.00100