Thermal activation effects in CoCrPtTa media due to stacking faults

We report magnetic measurements made on two CoCrPtTa thin film media, which were sputter deposited in identical conditions onto either CrMn or NiAl/CrMn underlayers grown on glass substrates. This produced films with [112~0] and [101~0] preferred orientations respectively. The films had stacking fau...

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Bibliographic Details
Published in:IEEE transactions on magnetics 2001-07, Vol.37 (4), p.1459-1461
Main Authors: Holloway, L., Laidler, H.
Format: Article
Language:English
Subjects:
Activation
Anisotropy
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Density
Exact sciences and technology
Glass
Intermetallics
Magnetic anisotropy
Magnetic films
Magnetic properties and materials
Magnetic properties of monolayers and thin films
Magnetic properties of surface, thin films and multilayers
Magnetic switching
Magnetic variables measurement
Magnetism
Media
Nickel aluminides
Perpendicular magnetic anisotropy
Physics
Sputtering
Stacking
Stacking faults
Substrates
Switching
Viscosity
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Summary:We report magnetic measurements made on two CoCrPtTa thin film media, which were sputter deposited in identical conditions onto either CrMn or NiAl/CrMn underlayers grown on glass substrates. This produced films with [112~0] and [101~0] preferred orientations respectively. The films had stacking fault densities of 8/spl plusmn/1% and 13/spl plusmn/1% respectively. Increased magnetic viscosity and switching at low fields in the switching field distributions were observed which correlates well with the level of FCC-like regions. We find that the energy barriers to reversal in these films are dominated by the anisotropy field distribution rather than the distribution of grain-sizes. Furthermore, it is clear that even relatively low levels of stacking faults cause significant levels of thermally activated magnetization reversal which may cause reduced thermal stability of written information.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.950870