March test and on-chip test circuit of flash memories

A March test, namely "March Flash" and an on-chip test circuit are presented to detect all single functional fault model with only 4 elements to gain 100% fault coverage and to detect all the parametric faults, respectively. These two methods can be integrated to solve the testing problems...

Full description

Saved in:
Bibliographic Details
Main Authors: Jiun-Nan Ko, Jing-Reng Huang, Tsin-Yuan Chang
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit testing
Counting circuits
Electrical fault detection
Fault detection
Flash memory
Hardware
Nonvolatile memory
Threshold voltage
Writing
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A March test, namely "March Flash" and an on-chip test circuit are presented to detect all single functional fault model with only 4 elements to gain 100% fault coverage and to detect all the parametric faults, respectively. These two methods can be integrated to solve the testing problems of NAND- and NOR- type flash memories. With the hardware penalty of a 3- or 4-bit counter, test of a flash memory can be achieved in few seconds by adopting these proposed test strategies.
DOI:10.1109/MWSCAS.2000.951602