March test and on-chip test circuit of flash memories

A March test, namely "March Flash" and an on-chip test circuit are presented to detect all single functional fault model with only 4 elements to gain 100% fault coverage and to detect all the parametric faults, respectively. These two methods can be integrated to solve the testing problems...

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Main Authors: Jiun-Nan Ko, Jing-Reng Huang, Tsin-Yuan Chang
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit testing
Counting circuits
Electrical fault detection
Fault detection
Flash memory
Hardware
Nonvolatile memory
Threshold voltage
Writing
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Jing-Reng Huang
Tsin-Yuan Chang
description A March test, namely "March Flash" and an on-chip test circuit are presented to detect all single functional fault model with only 4 elements to gain 100% fault coverage and to detect all the parametric faults, respectively. These two methods can be integrated to solve the testing problems of NAND- and NOR- type flash memories. With the hardware penalty of a 3- or 4-bit counter, test of a flash memory can be achieved in few seconds by adopting these proposed test strategies.
doi_str_mv 10.1109/MWSCAS.2000.951602
format conference_proceeding
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subjects Circuit faults
Circuit testing
Counting circuits
Electrical fault detection
Fault detection
Flash memory
Hardware
Nonvolatile memory
Threshold voltage
Writing
title March test and on-chip test circuit of flash memories
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