Nanoscale THz imaging and spectroscopy at ambient and cryogenic sub 10 K temperatures

Scattering near-field optical microscopy (s-SNOM) is a powerful technique that can provide wavelength independent optical resolution (< 20 nm), by surmounting the diffraction limit in traditional THz imaging. In this presentation, we report on the implementation of near-field THz s-SNOM for the n...

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Bibliographic Details
Main Authors: Hartmann, Nicolai, Wang, Xiaolong, Huber, Andreas J.
Format: Conference Proceeding
Language:English
Online Access:Request full text
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Summary:Scattering near-field optical microscopy (s-SNOM) is a powerful technique that can provide wavelength independent optical resolution (< 20 nm), by surmounting the diffraction limit in traditional THz imaging. In this presentation, we report on the implementation of near-field THz s-SNOM for the nanoscale characterization of frequency dependent free carrier response in semiconductors and 2D materials. The specifically designed near-field microscope enables measurements at room temperature and at cryogenic temperatures.
ISSN:2162-2035
DOI:10.1109/IRMMW-THz50926.2021.9566993