Nanoscale THz imaging and spectroscopy at ambient and cryogenic sub 10 K temperatures
Scattering near-field optical microscopy (s-SNOM) is a powerful technique that can provide wavelength independent optical resolution (< 20 nm), by surmounting the diffraction limit in traditional THz imaging. In this presentation, we report on the implementation of near-field THz s-SNOM for the n...
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Main Authors: | , , |
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Format: | Conference Proceeding |
Language: | English |
Online Access: | Request full text |
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Summary: | Scattering near-field optical microscopy (s-SNOM) is a powerful technique that can provide wavelength independent optical resolution (< 20 nm), by surmounting the diffraction limit in traditional THz imaging. In this presentation, we report on the implementation of near-field THz s-SNOM for the nanoscale characterization of frequency dependent free carrier response in semiconductors and 2D materials. The specifically designed near-field microscope enables measurements at room temperature and at cryogenic temperatures. |
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ISSN: | 2162-2035 |
DOI: | 10.1109/IRMMW-THz50926.2021.9566993 |