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The Photosensitive Mechanism of Gap-Type Amorphous Silicon TFT
Gap-type amorphous silicon (a-Si) thin-film transistor (TFT) can provide high photo current in simple device structure, which makes it suitable for large-area-sensing applications. The reason why the photo current is much higher when the device is operated in the on-region than that in the off-regio...
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Published in: | IEEE transactions on electron devices 2021-12, Vol.68 (12), p.6177-6181 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Gap-type amorphous silicon (a-Si) thin-film transistor (TFT) can provide high photo current in simple device structure, which makes it suitable for large-area-sensing applications. The reason why the photo current is much higher when the device is operated in the on-region than that in the off-region is not well studied. In this article, we propose the mechanism to explain this special phenomenon for the gap-type a-Si TFT. The feature of potential well is supported by TCAD simulation. The mechanism is further verified from the perspective of temperature effect and time response. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/TED.2021.3120231 |