Low-frequency 1/f noise in a graphene/silicon X-ray detector

Photodetectors based on graphene attracted widespread attention because of their superior properties. We have evaluated the low-frequency noise of a graphene-based X-ray detector manufactured from graphene oxide (GO) through a laser process. The low-frequency noise's temperature dependence indi...

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Bibliographic Details
Main Authors: Deng, Ningqin, Wang, Pan, Zhang, Enxia, Guo, Bin, Li, Dehong, Ma, Boxuan, Fleetwood, Daniel M., Tian, He, Zhang, Jian
Format: Conference Proceeding
Language:English
Subjects:
1/f Noise
Density measurement
Graphene
Laser noise
Temperature distribution
Temperature measurement
Voltage measurement
X-ray detector
X-ray detectors
Online Access:Request full text
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Summary:Photodetectors based on graphene attracted widespread attention because of their superior properties. We have evaluated the low-frequency noise of a graphene-based X-ray detector manufactured from graphene oxide (GO) through a laser process. The low-frequency noise's temperature dependence indicates a nonuniform energy distribution of traps in the device due to a distribution of defects and impurities, most likely due to O-vacancies and hydrogen.
ISSN:2694-510X
DOI:10.1109/3M-NANO49087.2021.9599829