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Descriptor Sampling VLSI Design Based on BRIEF Algorithm for Surrounding View Application

This paper presents a new descriptor sampling method based on Binary Robust Independent Elementary Features (BRIEF). The proposed method is divided into several steps, split blocks, sampling, and descriptor construction. The proposed descriptor sampling method is realized by Very Large-Scale Integra...

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Bibliographic Details
Main Authors: Lin, Jr-Yu, Chou, He-Sheng, Su, Kun-Ze, Ke, Shih-Yao, Lo, Wen-Shen, Chen, Chiung-An, Chen, Shih-Lun
Format: Conference Proceeding
Language:English
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Summary:This paper presents a new descriptor sampling method based on Binary Robust Independent Elementary Features (BRIEF). The proposed method is divided into several steps, split blocks, sampling, and descriptor construction. The proposed descriptor sampling method is realized by Very Large-Scale Integration (VLSI) technique. The usage of the split blocks keeps average accuracy attaining 88.01% and reduces 75% gate counts by using the same sampling model to construct descriptions. Comparing with previous studies, this design shows lower hardware cost and higher accuracy.
ISSN:2575-8284
DOI:10.1109/ICCE-TW52618.2021.9603183