Changing The Paradigm In Common Mode Transient Immunity (CMTI) Testing Of Dual Channel Galvanically Isolated Gate Drivers

This paper presents a method to measure the CMTI performance of dual channel galvanically isolated gate drivers using transformers and filtering capacitors on the outputs. As a result, typical application CMTI conditions are replicated. The working principle was successfully verified using a 5 V and...

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Bibliographic Details
Main Authors: Vladoianu, F., Strelec, M., Hurez, I., Anghel, V., Brezeanu, G.
Format: Conference Proceeding
Language:English
Subjects:
Benchmark testing
Capacitors
CMTI testing
Common Mode Transient Immunity
Couplings
dual channel gate driver
Filtering
galvanic isolation
Logic gates
Pulse width modulation
Semiconductor device measurement
transformer
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Description
Summary:This paper presents a method to measure the CMTI performance of dual channel galvanically isolated gate drivers using transformers and filtering capacitors on the outputs. As a result, typical application CMTI conditions are replicated. The working principle was successfully verified using a 5 V and 50% duty cycle PWM pulse with 10 ns rise and fall times. Three commercially available dual channel galvanically isolated gate drivers were used to evaluate the proposed setup in comparison with the state-of-the-art approach. CMTI slopes of ±50 kV/μs, ±95 kV/μs, and ±125 kV/μs, together with a common mode pulse of ±1.5 kV were used in the assessment. The state-of-the-art method showed several CMTI failures, whereas the proposed setup passed all conditions.
ISSN:2377-0678
DOI:10.1109/CAS52836.2021.9604169