AC-JTAG: empowering JTAG beyond testing DC nets

Presents the new technology that extends today's JTAG's capability from DC domain to both AC and DC domains. New concept, AC_EXTEST is introduced to support AC interconnection test and to have backward compatibility with EXTEST. It leverages existing application software available within t...

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Bibliographic Details
Main Authors: Chung, S.S., Baeg, S.H.
Format: Conference Proceeding
Language:English
Subjects:
High speed optical techniques
Manufacturing industries
Optical devices
Optical interconnections
Optical noise
Optical receivers
Stimulated emission
Switches
Testing
Vertical cavity surface emitting lasers
Online Access:Request full text
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Description
Summary:Presents the new technology that extends today's JTAG's capability from DC domain to both AC and DC domains. New concept, AC_EXTEST is introduced to support AC interconnection test and to have backward compatibility with EXTEST. It leverages existing application software available within the boundary-scan test industry to promote this technology to the manufacturing floor with minimal impact.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2001.966615