Bipolar Random Spike and Bipolar Random Number Generation by Two Magnetic Tunnel Junctions

In several recent studies, the probabilistic nature of magnetic tunnel junction (MTJ) switching has been utilized rather than suppressed for proposals and demonstrations of specific or novel scenarios or applications, such as true random number generation, neural spike generation, stochastic computi...

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Bibliographic Details
Published in:IEEE transactions on electron devices 2022-03, Vol.69 (3), p.1582-1587
Main Authors: Lv, Yang, Zink, Brandon R., Wang, Jian-Ping
Format: Article
Language:English
Subjects:
Bipolar encoding
bipolar random signal
Electric potential
Encoding
magnetic tunnel junction (MTJ)
Magnetic tunneling
magnetization reversal
Magnetoresistance
Magnetoresistivity
neuromorphic computing
NIST
Probabilistic logic
Probability theory
random number generation
Random numbers
Random signals
Signal generation
spin transfer torque (STT)
stochastic computing (SC)
Stochastic processes
Switches
Switching
Tunnel junctions
tunnel magnetoresistance
Voltage
Voltage measurement
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Summary:In several recent studies, the probabilistic nature of magnetic tunnel junction (MTJ) switching has been utilized rather than suppressed for proposals and demonstrations of specific or novel scenarios or applications, such as true random number generation, neural spike generation, stochastic computing (SC), and probabilistic spin logic. Among all schemes of operations for generating tunable random signals, dual-biasing is very simple but also robust against device variations. When an MTJ is connected to a voltage source with polarity encouraging parallel (P)-to-antiparallel (AP) switching by spin-transfer torque (STT), and under a static bias field that favors P-state, the MTJ can switch back and forth between two states randomly, due to the state-dependent modulation of current by the tunneling magnetoresistance (TMR) of the MTJ. In this work, we demonstrate bipolar random signal generation by connecting two MTJs in series with a voltage source.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2022.3144117