Measurement of dispersion in a silicon waveguide at 1.5 /spl mu/m

We report for the first time measurements of the dispersion coefficient in a silicon waveguide at 1.5 /spl mu/m wavelength. The total dispersion was found to be only -9.1 fs/[nm.cm].

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Bibliographic Details
Main Authors: Liang, T.K., Tsang, H.K., Roberts, S.W., Brady, D.J., Harpin, A., Drake, J., Asghari, M.
Format: Conference Proceeding
Language:English
Subjects:
Delay effects
Dispersion
Optical interferometry
Optical refraction
Optical variables control
Optical waveguides
Semiconductor optical amplifiers
Semiconductor waveguides
Silicon
Wavelength measurement
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Description
Summary:We report for the first time measurements of the dispersion coefficient in a silicon waveguide at 1.5 /spl mu/m wavelength. The total dispersion was found to be only -9.1 fs/[nm.cm].
DOI:10.1109/CLEOPR.2001.971163