Loading…

SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability

A SiC-based intelligent power stage (IPS) with zero-voltage-ride-through (ZVRT) and device prognosis & diagnosis (P&D) capability is proposed for power electronics grid interface systems. Compared to other grid-tied power converters, the proposed IPS embeds online health monitoring of SiC de...

Full description

Saved in:

Bibliographic Details
Main Authors:	Dong, Xiaofeng, Li, Hui, Martin, Sandro, Kim, Sanghun, Han, Dongwoo, Peng, Fang Z., Moon, Jinyeong, Li, Yuan, Chinthavali, M. S., Moorthy, RSK
Format:	Conference Proceeding
Language:	English
Subjects:	Active gate drive Communication Health monitoring Intelligent power stage IP networks Optical fiber communication Optical fiber devices Prognosis & diagnosis Prognostics and health management Prototypes SiC Silicon carbide Steady-state Zero-voltage-ride-through
Online Access:	Request full text
Tags:	Add Tag No Tags, Be the first to tag this record!

cited_by
cites
container_end_page	1531
container_issue
container_start_page	1525
container_title
container_volume
creator	Dong, Xiaofeng Li, Hui Martin, Sandro Kim, Sanghun Han, Dongwoo Peng, Fang Z. Moon, Jinyeong Li, Yuan Chinthavali, M. S. Moorthy, RSK
description	A SiC-based intelligent power stage (IPS) with zero-voltage-ride-through (ZVRT) and device prognosis & diagnosis (P&D) capability is proposed for power electronics grid interface systems. Compared to other grid-tied power converters, the proposed IPS embeds online health monitoring of SiC device into its intelligent and integrated gate drivers (i2GDs). In addition, a low-latency hardware-based approach with fast-response is developed to suppress large inrush current during ZVRT transients. The fiber-optic based robust communication architecture to transfer SiC device health status signals, P&D information, PWM signals, as well as fault signals between IPS local controller and i2GDs are illustrated. A 50kW IPS prototype is built and tested in the laboratory. Simulation and experimental results are presented to validate the advanced features of proposed IPS.
doi_str_mv	10.1109/APEC43599.2022.9773384
format	conference_proceeding
fullrecord	<record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_9773384</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9773384</ieee_id><sourcerecordid>9773384</sourcerecordid><originalsourceid>FETCH-LOGICAL-i203t-a4cf6fcdf073f447a73c1276029afbb39170840257a38a5f2b729d79d0acd82f3</originalsourceid><addsrcrecordid>eNotkE1Lw0AUAFdBsK3-AkH25C3x7Uf2ZY81rVooGGxV8FJekt24EtOSBEv_vQdzmjnNYRi7FRALAfZ-ni8zrRJrYwlSxhZRqVSfsakwJtFg0hTP2URqhMgYjZds2vffAFKhMBP2sQlZ9EC9q_iqHVzThNq1A8_3R9fxzUC148cwfPGF-w2l43m3r9t9H3p-xxeBRqe24p_vr1ue0YGK0IThdMUuPDW9ux45Y2-Py232HK1fnlbZfB0FCWqISJfe-LLygMprjYSqFBINSEu-KJQVCKkGmSCplBIvC5S2QlsBlVUqvZqxm_9ucM7tDl34oe60GyeoP5LPUQk</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability</title><source>IEEE Xplore All Conference Series</source><creator>Dong, Xiaofeng ; Li, Hui ; Martin, Sandro ; Kim, Sanghun ; Han, Dongwoo ; Peng, Fang Z. ; Moon, Jinyeong ; Li, Yuan ; Chinthavali, M. S. ; Moorthy, RSK</creator><creatorcontrib>Dong, Xiaofeng ; Li, Hui ; Martin, Sandro ; Kim, Sanghun ; Han, Dongwoo ; Peng, Fang Z. ; Moon, Jinyeong ; Li, Yuan ; Chinthavali, M. S. ; Moorthy, RSK</creatorcontrib><description>A SiC-based intelligent power stage (IPS) with zero-voltage-ride-through (ZVRT) and device prognosis & diagnosis (P&D) capability is proposed for power electronics grid interface systems. Compared to other grid-tied power converters, the proposed IPS embeds online health monitoring of SiC device into its intelligent and integrated gate drivers (i2GDs). In addition, a low-latency hardware-based approach with fast-response is developed to suppress large inrush current during ZVRT transients. The fiber-optic based robust communication architecture to transfer SiC device health status signals, P&D information, PWM signals, as well as fault signals between IPS local controller and i2GDs are illustrated. A 50kW IPS prototype is built and tested in the laboratory. Simulation and experimental results are presented to validate the advanced features of proposed IPS.</description><identifier>EISSN: 2470-6647</identifier><identifier>EISBN: 1665406887</identifier><identifier>EISBN: 9781665406888</identifier><identifier>DOI: 10.1109/APEC43599.2022.9773384</identifier><language>eng</language><publisher>IEEE</publisher><subject>Active gate drive ; Communication ; Health monitoring ; Intelligent power stage ; IP networks ; Optical fiber communication ; Optical fiber devices ; Prognosis & diagnosis ; Prognostics and health management ; Prototypes ; SiC ; Silicon carbide ; Steady-state ; Zero-voltage-ride-through</subject><ispartof>2022 IEEE Applied Power Electronics Conference and Exposition (APEC), 2022, p.1525-1531</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9773384$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,23930,23931,25140,27925,54555,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9773384$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Dong, Xiaofeng</creatorcontrib><creatorcontrib>Li, Hui</creatorcontrib><creatorcontrib>Martin, Sandro</creatorcontrib><creatorcontrib>Kim, Sanghun</creatorcontrib><creatorcontrib>Han, Dongwoo</creatorcontrib><creatorcontrib>Peng, Fang Z.</creatorcontrib><creatorcontrib>Moon, Jinyeong</creatorcontrib><creatorcontrib>Li, Yuan</creatorcontrib><creatorcontrib>Chinthavali, M. S.</creatorcontrib><creatorcontrib>Moorthy, RSK</creatorcontrib><title>SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability</title><title>2022 IEEE Applied Power Electronics Conference and Exposition (APEC)</title><addtitle>APEC</addtitle><description>A SiC-based intelligent power stage (IPS) with zero-voltage-ride-through (ZVRT) and device prognosis & diagnosis (P&D) capability is proposed for power electronics grid interface systems. Compared to other grid-tied power converters, the proposed IPS embeds online health monitoring of SiC device into its intelligent and integrated gate drivers (i2GDs). In addition, a low-latency hardware-based approach with fast-response is developed to suppress large inrush current during ZVRT transients. The fiber-optic based robust communication architecture to transfer SiC device health status signals, P&D information, PWM signals, as well as fault signals between IPS local controller and i2GDs are illustrated. A 50kW IPS prototype is built and tested in the laboratory. Simulation and experimental results are presented to validate the advanced features of proposed IPS.</description><subject>Active gate drive</subject><subject>Communication</subject><subject>Health monitoring</subject><subject>Intelligent power stage</subject><subject>IP networks</subject><subject>Optical fiber communication</subject><subject>Optical fiber devices</subject><subject>Prognosis & diagnosis</subject><subject>Prognostics and health management</subject><subject>Prototypes</subject><subject>SiC</subject><subject>Silicon carbide</subject><subject>Steady-state</subject><subject>Zero-voltage-ride-through</subject><issn>2470-6647</issn><isbn>1665406887</isbn><isbn>9781665406888</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2022</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkE1Lw0AUAFdBsK3-AkH25C3x7Uf2ZY81rVooGGxV8FJekt24EtOSBEv_vQdzmjnNYRi7FRALAfZ-ni8zrRJrYwlSxhZRqVSfsakwJtFg0hTP2URqhMgYjZds2vffAFKhMBP2sQlZ9EC9q_iqHVzThNq1A8_3R9fxzUC148cwfPGF-w2l43m3r9t9H3p-xxeBRqe24p_vr1ue0YGK0IThdMUuPDW9ux45Y2-Py232HK1fnlbZfB0FCWqISJfe-LLygMprjYSqFBINSEu-KJQVCKkGmSCplBIvC5S2QlsBlVUqvZqxm_9ucM7tDl34oe60GyeoP5LPUQk</recordid><startdate>20220320</startdate><enddate>20220320</enddate><creator>Dong, Xiaofeng</creator><creator>Li, Hui</creator><creator>Martin, Sandro</creator><creator>Kim, Sanghun</creator><creator>Han, Dongwoo</creator><creator>Peng, Fang Z.</creator><creator>Moon, Jinyeong</creator><creator>Li, Yuan</creator><creator>Chinthavali, M. S.</creator><creator>Moorthy, RSK</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>20220320</creationdate><title>SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability</title><author>Dong, Xiaofeng ; Li, Hui ; Martin, Sandro ; Kim, Sanghun ; Han, Dongwoo ; Peng, Fang Z. ; Moon, Jinyeong ; Li, Yuan ; Chinthavali, M. S. ; Moorthy, RSK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i203t-a4cf6fcdf073f447a73c1276029afbb39170840257a38a5f2b729d79d0acd82f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Active gate drive</topic><topic>Communication</topic><topic>Health monitoring</topic><topic>Intelligent power stage</topic><topic>IP networks</topic><topic>Optical fiber communication</topic><topic>Optical fiber devices</topic><topic>Prognosis & diagnosis</topic><topic>Prognostics and health management</topic><topic>Prototypes</topic><topic>SiC</topic><topic>Silicon carbide</topic><topic>Steady-state</topic><topic>Zero-voltage-ride-through</topic><toplevel>online_resources</toplevel><creatorcontrib>Dong, Xiaofeng</creatorcontrib><creatorcontrib>Li, Hui</creatorcontrib><creatorcontrib>Martin, Sandro</creatorcontrib><creatorcontrib>Kim, Sanghun</creatorcontrib><creatorcontrib>Han, Dongwoo</creatorcontrib><creatorcontrib>Peng, Fang Z.</creatorcontrib><creatorcontrib>Moon, Jinyeong</creatorcontrib><creatorcontrib>Li, Yuan</creatorcontrib><creatorcontrib>Chinthavali, M. S.</creatorcontrib><creatorcontrib>Moorthy, RSK</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dong, Xiaofeng</au><au>Li, Hui</au><au>Martin, Sandro</au><au>Kim, Sanghun</au><au>Han, Dongwoo</au><au>Peng, Fang Z.</au><au>Moon, Jinyeong</au><au>Li, Yuan</au><au>Chinthavali, M. S.</au><au>Moorthy, RSK</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability</atitle><btitle>2022 IEEE Applied Power Electronics Conference and Exposition (APEC)</btitle><stitle>APEC</stitle><date>2022-03-20</date><risdate>2022</risdate><spage>1525</spage><epage>1531</epage><pages>1525-1531</pages><eissn>2470-6647</eissn><eisbn>1665406887</eisbn><eisbn>9781665406888</eisbn><abstract>A SiC-based intelligent power stage (IPS) with zero-voltage-ride-through (ZVRT) and device prognosis & diagnosis (P&D) capability is proposed for power electronics grid interface systems. Compared to other grid-tied power converters, the proposed IPS embeds online health monitoring of SiC device into its intelligent and integrated gate drivers (i2GDs). In addition, a low-latency hardware-based approach with fast-response is developed to suppress large inrush current during ZVRT transients. The fiber-optic based robust communication architecture to transfer SiC device health status signals, P&D information, PWM signals, as well as fault signals between IPS local controller and i2GDs are illustrated. A 50kW IPS prototype is built and tested in the laboratory. Simulation and experimental results are presented to validate the advanced features of proposed IPS.</abstract><pub>IEEE</pub><doi>10.1109/APEC43599.2022.9773384</doi><tpages>7</tpages></addata></record>
fulltext	fulltext_linktorsrc
identifier	EISSN: 2470-6647
ispartof	2022 IEEE Applied Power Electronics Conference and Exposition (APEC), 2022, p.1525-1531
issn	2470-6647
language	eng
recordid	cdi_ieee_primary_9773384
source	IEEE Xplore All Conference Series
subjects	Active gate drive Communication Health monitoring Intelligent power stage IP networks Optical fiber communication Optical fiber devices Prognosis & diagnosis Prognostics and health management Prototypes SiC Silicon carbide Steady-state Zero-voltage-ride-through
title	SiC-Based Intelligent Power Stage with Device Prognosis & Diagnosis and ZVRT Capability
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T11%3A53%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=SiC-Based%20Intelligent%20Power%20Stage%20with%20Device%20Prognosis%20&%20Diagnosis%20and%20ZVRT%20Capability&rft.btitle=2022%20IEEE%20Applied%20Power%20Electronics%20Conference%20and%20Exposition%20(APEC)&rft.au=Dong,%20Xiaofeng&rft.date=2022-03-20&rft.spage=1525&rft.epage=1531&rft.pages=1525-1531&rft.eissn=2470-6647&rft_id=info:doi/10.1109/APEC43599.2022.9773384&rft.eisbn=1665406887&rft.eisbn_list=9781665406888&rft_dat=%3Cieee_CHZPO%3E9773384%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i203t-a4cf6fcdf073f447a73c1276029afbb39170840257a38a5f2b729d79d0acd82f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=9773384&rfr_iscdi=true