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A Low-Power Column-Parallel ΣΔ ADC With Shared OTAs and Single-Bit-BWI Decimation Filter for CMOS Image Sensor
This article presents a low-power column-parallel \Sigma \Delta analog-to-digital converter (ADC) with shared operational transconductance amplifiers (OTAs) for CMOS image sensors (CISs). Through the proposed time division multiplexing of OTAs, the power consumption of the modulator achieves a red...
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Published in: | IEEE transactions on electron devices 2022-06, Vol.69 (6), p.2979-2985 |
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description | This article presents a low-power column-parallel \Sigma \Delta analog-to-digital converter (ADC) with shared operational transconductance amplifiers (OTAs) for CMOS image sensors (CISs). Through the proposed time division multiplexing of OTAs, the power consumption of the modulator achieves a reduction of about 40%. The proposed structure alleviates the layout requirement of OTAs, enabling implementation of a high-resolution low-power image sensor in advanced CMOS technology nodes. As the coupled noise introduced by the proposed column-shared scheme is suppressed to a lower level than the inherent crosstalk of adjacent pixels, the proposed structure only contributes a negligible inter-column coupled noise from the ADCs. Moreover, a compact digital decimation filter with a single-bit-bit-wise-inversion (BWI) topology is also proposed, which can reduce chip area significantly. The prototype sensor is fabricated in a 40-nm standard CMOS technology with 256 \times256 pixel array and 256 proposed column-parallel \Sigma \Delta ADCs. Each \Sigma \Delta ADC occupies a core area of 4.5 \mu \text{m}\,\,\times 310 \mu \text{m} , while consuming a power of 58.8 \mu \text{W} . The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are +0.49/−0.65 LSB and +5.1/−4.8 LSB, respectively. Measurement results show a dynamic range of 79.9 dB and an effective-number-of-bit (ENOB) of 11.4 bit. This work achieves a figure of merit (FOM) of 97.2 fJ/step. |
doi_str_mv | 10.1109/TED.2022.3171742 |
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Through the proposed time division multiplexing of OTAs, the power consumption of the modulator achieves a reduction of about 40%. The proposed structure alleviates the layout requirement of OTAs, enabling implementation of a high-resolution low-power image sensor in advanced CMOS technology nodes. As the coupled noise introduced by the proposed column-shared scheme is suppressed to a lower level than the inherent crosstalk of adjacent pixels, the proposed structure only contributes a negligible inter-column coupled noise from the ADCs. Moreover, a compact digital decimation filter with a single-bit-bit-wise-inversion (BWI) topology is also proposed, which can reduce chip area significantly. The prototype sensor is fabricated in a 40-nm standard CMOS technology with 256 <inline-formula> <tex-math notation="LaTeX">\times256 </tex-math></inline-formula> pixel array and 256 proposed column-parallel <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> ADCs. Each <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> ADC occupies a core area of 4.5 <inline-formula> <tex-math notation="LaTeX">\mu \text{m}\,\,\times </tex-math></inline-formula> 310 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>, while consuming a power of 58.8 <inline-formula> <tex-math notation="LaTeX">\mu \text{W} </tex-math></inline-formula>. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are +0.49/−0.65 LSB and +5.1/−4.8 LSB, respectively. Measurement results show a dynamic range of 79.9 dB and an effective-number-of-bit (ENOB) of 11.4 bit. This work achieves a figure of merit (FOM) of 97.2 fJ/step.]]></description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2022.3171742</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Analog to digital converters ; Analog-digital conversion ; Capacitors ; Clocks ; CMOS ; CMOS image sensor (CIS) ; column-parallel readout circuit ; Columnar structure ; Crosstalk ; digital decimation filter ; Digital imaging ; Figure of merit ; Image filters ; Image resolution ; low power ; Modulation ; Nonlinearity ; Operational amplifiers ; Pixels ; Power consumption ; Power demand ; Power management ; Registers ; Sensors ; shared operational transconductance amplifier (OTA) ; Time division multiplexing ; Topology ; Transconductance ; ΣΔ analog-to-digital converter (ADC)</subject><ispartof>IEEE transactions on electron devices, 2022-06, Vol.69 (6), p.2979-2985</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1366-87c4bbde66c74eb09d8418389fe20b087929b8b020f62b77a5b906ee4cce84643</citedby><cites>FETCH-LOGICAL-c1366-87c4bbde66c74eb09d8418389fe20b087929b8b020f62b77a5b906ee4cce84643</cites><orcidid>0000-0003-2453-4878 ; 0000-0002-2982-0497 ; 0000-0002-2071-9966 ; 0000-0003-4984-6093</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9775112$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Wang, Zhongjie</creatorcontrib><creatorcontrib>Ma, Qiyun</creatorcontrib><creatorcontrib>Yang, Tongbei</creatorcontrib><creatorcontrib>Lin, Zhi</creatorcontrib><creatorcontrib>Bermak, Amine</creatorcontrib><creatorcontrib>Tang, Fang</creatorcontrib><title>A Low-Power Column-Parallel ΣΔ ADC With Shared OTAs and Single-Bit-BWI Decimation Filter for CMOS Image Sensor</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description><![CDATA[This article presents a low-power column-parallel <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> analog-to-digital converter (ADC) with shared operational transconductance amplifiers (OTAs) for CMOS image sensors (CISs). Through the proposed time division multiplexing of OTAs, the power consumption of the modulator achieves a reduction of about 40%. The proposed structure alleviates the layout requirement of OTAs, enabling implementation of a high-resolution low-power image sensor in advanced CMOS technology nodes. As the coupled noise introduced by the proposed column-shared scheme is suppressed to a lower level than the inherent crosstalk of adjacent pixels, the proposed structure only contributes a negligible inter-column coupled noise from the ADCs. Moreover, a compact digital decimation filter with a single-bit-bit-wise-inversion (BWI) topology is also proposed, which can reduce chip area significantly. The prototype sensor is fabricated in a 40-nm standard CMOS technology with 256 <inline-formula> <tex-math notation="LaTeX">\times256 </tex-math></inline-formula> pixel array and 256 proposed column-parallel <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> ADCs. Each <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> ADC occupies a core area of 4.5 <inline-formula> <tex-math notation="LaTeX">\mu \text{m}\,\,\times </tex-math></inline-formula> 310 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>, while consuming a power of 58.8 <inline-formula> <tex-math notation="LaTeX">\mu \text{W} </tex-math></inline-formula>. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are +0.49/−0.65 LSB and +5.1/−4.8 LSB, respectively. Measurement results show a dynamic range of 79.9 dB and an effective-number-of-bit (ENOB) of 11.4 bit. This work achieves a figure of merit (FOM) of 97.2 fJ/step.]]></description><subject>Analog to digital converters</subject><subject>Analog-digital conversion</subject><subject>Capacitors</subject><subject>Clocks</subject><subject>CMOS</subject><subject>CMOS image sensor (CIS)</subject><subject>column-parallel readout circuit</subject><subject>Columnar structure</subject><subject>Crosstalk</subject><subject>digital decimation filter</subject><subject>Digital imaging</subject><subject>Figure of merit</subject><subject>Image filters</subject><subject>Image resolution</subject><subject>low power</subject><subject>Modulation</subject><subject>Nonlinearity</subject><subject>Operational amplifiers</subject><subject>Pixels</subject><subject>Power consumption</subject><subject>Power demand</subject><subject>Power management</subject><subject>Registers</subject><subject>Sensors</subject><subject>shared operational transconductance amplifier (OTA)</subject><subject>Time division multiplexing</subject><subject>Topology</subject><subject>Transconductance</subject><subject>ΣΔ analog-to-digital converter (ADC)</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNo9kM1qAjEUhUNpodZ2X-gm0HVskon5WU5HbQWLghaXw_zc0ZFxYjMj0vfoG_R9fKZGlK4uB845l_Mh9MhojzFqXhbDQY9TznsBU0wJfoU6rN9XxEghr1GHUqaJCXRwi-6aZuOlFIJ30C7EE3sgM3sAhyNb7bc1mSUuqSqo8PH3-IPDQYSXZbvG83XiIMfTRdjgpM7xvKxXFZDXsiWvyzEeQFZuk7a0NR6VVevrCusrP6ZzPN4mK8BzqBvr7tFNkVQNPFxuF32OhovonUymb-MonJCMBVISrTKRpjlImSkBKTW5FkwH2hTAaUq1MtykOqWcFpKnSiX91FAJILIMtJAi6KLnc-_O2a89NG28sXtX-5cxl9L4-UZI76JnV-Zs0zgo4p3zK9x3zGh84hp7rvGJa3zh6iNP50gJAP92o1SfMR78AQ4Qchc</recordid><startdate>202206</startdate><enddate>202206</enddate><creator>Wang, Zhongjie</creator><creator>Ma, Qiyun</creator><creator>Yang, Tongbei</creator><creator>Lin, Zhi</creator><creator>Bermak, Amine</creator><creator>Tang, Fang</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-2453-4878</orcidid><orcidid>https://orcid.org/0000-0002-2982-0497</orcidid><orcidid>https://orcid.org/0000-0002-2071-9966</orcidid><orcidid>https://orcid.org/0000-0003-4984-6093</orcidid></search><sort><creationdate>202206</creationdate><title>A Low-Power Column-Parallel ΣΔ ADC With Shared OTAs and Single-Bit-BWI Decimation Filter for CMOS Image Sensor</title><author>Wang, Zhongjie ; Ma, Qiyun ; Yang, Tongbei ; Lin, Zhi ; Bermak, Amine ; Tang, Fang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1366-87c4bbde66c74eb09d8418389fe20b087929b8b020f62b77a5b906ee4cce84643</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Analog to digital converters</topic><topic>Analog-digital conversion</topic><topic>Capacitors</topic><topic>Clocks</topic><topic>CMOS</topic><topic>CMOS image sensor (CIS)</topic><topic>column-parallel readout circuit</topic><topic>Columnar structure</topic><topic>Crosstalk</topic><topic>digital decimation filter</topic><topic>Digital imaging</topic><topic>Figure of merit</topic><topic>Image filters</topic><topic>Image resolution</topic><topic>low power</topic><topic>Modulation</topic><topic>Nonlinearity</topic><topic>Operational amplifiers</topic><topic>Pixels</topic><topic>Power consumption</topic><topic>Power demand</topic><topic>Power management</topic><topic>Registers</topic><topic>Sensors</topic><topic>shared operational transconductance amplifier (OTA)</topic><topic>Time division multiplexing</topic><topic>Topology</topic><topic>Transconductance</topic><topic>ΣΔ analog-to-digital converter (ADC)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Zhongjie</creatorcontrib><creatorcontrib>Ma, Qiyun</creatorcontrib><creatorcontrib>Yang, Tongbei</creatorcontrib><creatorcontrib>Lin, Zhi</creatorcontrib><creatorcontrib>Bermak, Amine</creatorcontrib><creatorcontrib>Tang, Fang</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Zhongjie</au><au>Ma, Qiyun</au><au>Yang, Tongbei</au><au>Lin, Zhi</au><au>Bermak, Amine</au><au>Tang, Fang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Low-Power Column-Parallel ΣΔ ADC With Shared OTAs and Single-Bit-BWI Decimation Filter for CMOS Image Sensor</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2022-06</date><risdate>2022</risdate><volume>69</volume><issue>6</issue><spage>2979</spage><epage>2985</epage><pages>2979-2985</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract><![CDATA[This article presents a low-power column-parallel <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> analog-to-digital converter (ADC) with shared operational transconductance amplifiers (OTAs) for CMOS image sensors (CISs). Through the proposed time division multiplexing of OTAs, the power consumption of the modulator achieves a reduction of about 40%. The proposed structure alleviates the layout requirement of OTAs, enabling implementation of a high-resolution low-power image sensor in advanced CMOS technology nodes. As the coupled noise introduced by the proposed column-shared scheme is suppressed to a lower level than the inherent crosstalk of adjacent pixels, the proposed structure only contributes a negligible inter-column coupled noise from the ADCs. Moreover, a compact digital decimation filter with a single-bit-bit-wise-inversion (BWI) topology is also proposed, which can reduce chip area significantly. The prototype sensor is fabricated in a 40-nm standard CMOS technology with 256 <inline-formula> <tex-math notation="LaTeX">\times256 </tex-math></inline-formula> pixel array and 256 proposed column-parallel <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> ADCs. Each <inline-formula> <tex-math notation="LaTeX">\Sigma \Delta </tex-math></inline-formula> ADC occupies a core area of 4.5 <inline-formula> <tex-math notation="LaTeX">\mu \text{m}\,\,\times </tex-math></inline-formula> 310 <inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula>, while consuming a power of 58.8 <inline-formula> <tex-math notation="LaTeX">\mu \text{W} </tex-math></inline-formula>. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are +0.49/−0.65 LSB and +5.1/−4.8 LSB, respectively. Measurement results show a dynamic range of 79.9 dB and an effective-number-of-bit (ENOB) of 11.4 bit. This work achieves a figure of merit (FOM) of 97.2 fJ/step.]]></abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TED.2022.3171742</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0003-2453-4878</orcidid><orcidid>https://orcid.org/0000-0002-2982-0497</orcidid><orcidid>https://orcid.org/0000-0002-2071-9966</orcidid><orcidid>https://orcid.org/0000-0003-4984-6093</orcidid></addata></record> |
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subjects | Analog to digital converters Analog-digital conversion Capacitors Clocks CMOS CMOS image sensor (CIS) column-parallel readout circuit Columnar structure Crosstalk digital decimation filter Digital imaging Figure of merit Image filters Image resolution low power Modulation Nonlinearity Operational amplifiers Pixels Power consumption Power demand Power management Registers Sensors shared operational transconductance amplifier (OTA) Time division multiplexing Topology Transconductance ΣΔ analog-to-digital converter (ADC) |
title | A Low-Power Column-Parallel ΣΔ ADC With Shared OTAs and Single-Bit-BWI Decimation Filter for CMOS Image Sensor |
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