Compendium of Current Heavy Ion Single-Event Effects Test Results for Candidate Electronics for NASA Johnson Space Center

We present radiation effects test results and analysis produced by NASA JSC in 2021 for candidate electronic components and devices. Devices tested include integrated circuits, MOSFETs, DC-DC converters, and various commercial solutions.

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Bibliographic Details
Main Authors: Pritts, Joshua M., Gaza, Razvan, Bailey, Charles R., Nguyen, Kyson V.
Format: Conference Proceeding
Language:English
Subjects:
Conferences
DC-DC power converters
Electronic components
Integrated circuits
MOSFET
NASA
Radiation effects
Online Access:Request full text
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Description
Summary:We present radiation effects test results and analysis produced by NASA JSC in 2021 for candidate electronic components and devices. Devices tested include integrated circuits, MOSFETs, DC-DC converters, and various commercial solutions.
ISSN:2154-0535
DOI:10.1109/REDW56037.2022.9921663