Yield model with redundancy based on critical area calculations

To optimize the redundancy design, the yield model with redundancy is proposed. In this model the accurate number of redundancies to repair one fault is taken into consideration. The calculated yield with redundancy by using this model and the real one are in good agreement. As a result of the appli...

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Bibliographic Details
Main Authors: Mitsutake, K., Ushiku, Y.
Format: Conference Proceeding
Language:English
Subjects:
Design engineering
Design optimization
Manufacturing processes
Microscopy
Probability
Redundancy
Semiconductor device manufacture
Semiconductor device modeling
Virtual manufacturing
Online Access:Request full text
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Description
Summary:To optimize the redundancy design, the yield model with redundancy is proposed. In this model the accurate number of redundancies to repair one fault is taken into consideration. The calculated yield with redundancy by using this model and the real one are in good agreement. As a result of the application for several redundancy designs, a guide to obtain higher yield is presented.
ISSN:1523-553X
DOI:10.1109/ISSM.2000.993645