Analysis and Correction of Smeared Image From Interline-Transfer CCD in Beam Quality Measurement

The smear effect caused by light penetration of interline-transfer (IT) CCD in beam quality measurement (BQM) is detrimental and not analyzed pertinently. This report proposes a mathematical model and a correction method for the smeared image. The smear noise is fitted and subtracted through its cor...

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Bibliographic Details
Published in:IEEE photonics journal 2022-12, Vol.14 (6), p.1-8
Main Authors: Luo, Jie, Qin, Laian, Hou, Zaihong, Zhu, Wenyue, He, Feng, Guan, Wenlu, Cheng, Yilun
Format: Article
Language:English
Subjects:
Charge coupled devices
Charge-coupled-device (CCD) image sensor
Image quality
interline transfer (IT)
Landline
Laser beams
Mathematical models
Measurement by laser beam
Optical imaging
Q-factor
Quality assessment
Smear
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Summary:The smear effect caused by light penetration of interline-transfer (IT) CCD in beam quality measurement (BQM) is detrimental and not analyzed pertinently. This report proposes a mathematical model and a correction method for the smeared image. The smear noise is fitted and subtracted through its correlation with the light signal obtained from the model and pre-calibration. The application in BQM is presented by measuring beam quality factor M 2 and power in the bucket (PIB). The results verify the validity of the method. An evaluation standard of the correction effect is also recommended.
ISSN:1943-0655
1943-0655
1943-0647
DOI:10.1109/JPHOT.2022.3227581