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Well Done, Professor Michael C. Fairhurst

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Bibliographic Details
Published in:IET biometrics 2020-07, Vol.9 (4), p.135-135
Main Author: Wayman, James L
Format: Article
Language:English
Subjects:
Online Access:Request full text
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ISSN:2047-4938
2047-4946
2047-4946
DOI:10.1049/iet-bmt.2020.0073