A Nonparametric Synthetic Control Chart Using Sign Statistic

This article presents a synthetic control chart for detection of shifts in the process median. The synthetic chart is a combination of sign chart and conforming run-length chart. The performance evaluation of the proposed chart indicates that the synthetic chart has a higher power of detecting shift...

Full description

Saved in:
Bibliographic Details
Published in:Communications in statistics. Theory and methods 2010-01, Vol.39 (18), p.3282-3293
Main Authors: Khilare, S. K., Shirke, D. T.
Format: Article
Language:English
Subjects:
Applications
Average run length
Control charts
CRL chart
Exact sciences and technology
General topics
Mathematics
Multivariate analysis
Nonparametric control chart
Primary 62G86
Probability and statistics
Reliability, life testing, quality control
Sciences and techniques of general use
Secondary 62P30
Sign statistic
Statistics
Studies
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c468t-49cf65cd42ed4a5c5e2afe6e8834448d032b9deb7bee812b8af99933a2e6f203
cites cdi_FETCH-LOGICAL-c468t-49cf65cd42ed4a5c5e2afe6e8834448d032b9deb7bee812b8af99933a2e6f203
container_end_page 3293
container_issue 18
container_start_page 3282
container_title Communications in statistics. Theory and methods
container_volume 39
creator Khilare, S. K.
Shirke, D. T.
description This article presents a synthetic control chart for detection of shifts in the process median. The synthetic chart is a combination of sign chart and conforming run-length chart. The performance evaluation of the proposed chart indicates that the synthetic chart has a higher power of detecting shifts in process median than the Shewhart charts based on sign statistic as well as the classical Shewhart X-bar chart for various symmetric distributions. The improvement is significant for shifts of moderate to large shifts in the median. The robustness studies of the proposed synthetic control chart against outliers indicate that the proposed synthetic control chart is robust against contamination by outliers.
doi_str_mv 10.1080/03610920903249576
format article
fullrecord <record><control><sourceid>proquest_infor</sourceid><recordid>TN_cdi_informaworld_taylorfrancis_310_1080_03610920903249576</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>849471004</sourcerecordid><originalsourceid>FETCH-LOGICAL-c468t-49cf65cd42ed4a5c5e2afe6e8834448d032b9deb7bee812b8af99933a2e6f203</originalsourceid><addsrcrecordid>eNqNkE1LAzEQhoMoWD9-gLcFEU-r-d4EvJTiFxQ9tIK3kGaz7co2qUmK9t-bUvVgET3NwDzPy8wAcILgBYICXkLCEZQYSkgwlaziO6CHGMElRex5F_TW8zIDfB8cxPgCIWKVID1w1S8evFvooOc2hdYUo5VLM5tyN_AuBd8Vg5kOqXiKrZsWo3bqilHSqY0ZOQJ7je6iPf6sh2B8cz0e3JXDx9v7QX9YGspFKqk0DWemptjWVDPDLNaN5VYIQikVdV55Ims7qSbWCoQnQjdSSkI0trzBkByC803sIvjXpY1JzdtobNdpZ_0yKkElrRCE9H9k5lgmT3-QL34ZXL5CISw4FwxTkim0oUzwMQbbqEVo5zqsFIJq_Xe19ffsnH0m62h01wTtTBu_RUwoysr6qmrDta7xYa7ffOhqlfSq8-FL2kpX6T1l8-pPk_y-4AfHSKXY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1286685243</pqid></control><display><type>article</type><title>A Nonparametric Synthetic Control Chart Using Sign Statistic</title><source>Taylor and Francis Science and Technology Collection</source><creator>Khilare, S. K. ; Shirke, D. T.</creator><creatorcontrib>Khilare, S. K. ; Shirke, D. T.</creatorcontrib><description>This article presents a synthetic control chart for detection of shifts in the process median. The synthetic chart is a combination of sign chart and conforming run-length chart. The performance evaluation of the proposed chart indicates that the synthetic chart has a higher power of detecting shifts in process median than the Shewhart charts based on sign statistic as well as the classical Shewhart X-bar chart for various symmetric distributions. The improvement is significant for shifts of moderate to large shifts in the median. The robustness studies of the proposed synthetic control chart against outliers indicate that the proposed synthetic control chart is robust against contamination by outliers.</description><identifier>ISSN: 0361-0926</identifier><identifier>EISSN: 1532-415X</identifier><identifier>DOI: 10.1080/03610920903249576</identifier><identifier>CODEN: CSTMDC</identifier><language>eng</language><publisher>Philadelphia, PA: Taylor &amp; Francis Group</publisher><subject>Applications ; Average run length ; Control charts ; CRL chart ; Exact sciences and technology ; General topics ; Mathematics ; Multivariate analysis ; Nonparametric control chart ; Primary 62G86 ; Probability and statistics ; Reliability, life testing, quality control ; Sciences and techniques of general use ; Secondary 62P30 ; Sign statistic ; Statistics ; Studies</subject><ispartof>Communications in statistics. Theory and methods, 2010-01, Vol.39 (18), p.3282-3293</ispartof><rights>Copyright Taylor &amp; Francis Group, LLC 2010</rights><rights>2015 INIST-CNRS</rights><rights>Copyright Taylor and Francis Group, LLC</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c468t-49cf65cd42ed4a5c5e2afe6e8834448d032b9deb7bee812b8af99933a2e6f203</citedby><cites>FETCH-LOGICAL-c468t-49cf65cd42ed4a5c5e2afe6e8834448d032b9deb7bee812b8af99933a2e6f203</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=23416100$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Khilare, S. K.</creatorcontrib><creatorcontrib>Shirke, D. T.</creatorcontrib><title>A Nonparametric Synthetic Control Chart Using Sign Statistic</title><title>Communications in statistics. Theory and methods</title><description>This article presents a synthetic control chart for detection of shifts in the process median. The synthetic chart is a combination of sign chart and conforming run-length chart. The performance evaluation of the proposed chart indicates that the synthetic chart has a higher power of detecting shifts in process median than the Shewhart charts based on sign statistic as well as the classical Shewhart X-bar chart for various symmetric distributions. The improvement is significant for shifts of moderate to large shifts in the median. The robustness studies of the proposed synthetic control chart against outliers indicate that the proposed synthetic control chart is robust against contamination by outliers.</description><subject>Applications</subject><subject>Average run length</subject><subject>Control charts</subject><subject>CRL chart</subject><subject>Exact sciences and technology</subject><subject>General topics</subject><subject>Mathematics</subject><subject>Multivariate analysis</subject><subject>Nonparametric control chart</subject><subject>Primary 62G86</subject><subject>Probability and statistics</subject><subject>Reliability, life testing, quality control</subject><subject>Sciences and techniques of general use</subject><subject>Secondary 62P30</subject><subject>Sign statistic</subject><subject>Statistics</subject><subject>Studies</subject><issn>0361-0926</issn><issn>1532-415X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqNkE1LAzEQhoMoWD9-gLcFEU-r-d4EvJTiFxQ9tIK3kGaz7co2qUmK9t-bUvVgET3NwDzPy8wAcILgBYICXkLCEZQYSkgwlaziO6CHGMElRex5F_TW8zIDfB8cxPgCIWKVID1w1S8evFvooOc2hdYUo5VLM5tyN_AuBd8Vg5kOqXiKrZsWo3bqilHSqY0ZOQJ7je6iPf6sh2B8cz0e3JXDx9v7QX9YGspFKqk0DWemptjWVDPDLNaN5VYIQikVdV55Ims7qSbWCoQnQjdSSkI0trzBkByC803sIvjXpY1JzdtobNdpZ_0yKkElrRCE9H9k5lgmT3-QL34ZXL5CISw4FwxTkim0oUzwMQbbqEVo5zqsFIJq_Xe19ffsnH0m62h01wTtTBu_RUwoysr6qmrDta7xYa7ffOhqlfSq8-FL2kpX6T1l8-pPk_y-4AfHSKXY</recordid><startdate>20100101</startdate><enddate>20100101</enddate><creator>Khilare, S. K.</creator><creator>Shirke, D. T.</creator><general>Taylor &amp; Francis Group</general><general>Taylor &amp; Francis</general><general>Taylor &amp; Francis Ltd</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20100101</creationdate><title>A Nonparametric Synthetic Control Chart Using Sign Statistic</title><author>Khilare, S. K. ; Shirke, D. T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c468t-49cf65cd42ed4a5c5e2afe6e8834448d032b9deb7bee812b8af99933a2e6f203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Applications</topic><topic>Average run length</topic><topic>Control charts</topic><topic>CRL chart</topic><topic>Exact sciences and technology</topic><topic>General topics</topic><topic>Mathematics</topic><topic>Multivariate analysis</topic><topic>Nonparametric control chart</topic><topic>Primary 62G86</topic><topic>Probability and statistics</topic><topic>Reliability, life testing, quality control</topic><topic>Sciences and techniques of general use</topic><topic>Secondary 62P30</topic><topic>Sign statistic</topic><topic>Statistics</topic><topic>Studies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Khilare, S. K.</creatorcontrib><creatorcontrib>Shirke, D. T.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>Communications in statistics. Theory and methods</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Khilare, S. K.</au><au>Shirke, D. T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Nonparametric Synthetic Control Chart Using Sign Statistic</atitle><jtitle>Communications in statistics. Theory and methods</jtitle><date>2010-01-01</date><risdate>2010</risdate><volume>39</volume><issue>18</issue><spage>3282</spage><epage>3293</epage><pages>3282-3293</pages><issn>0361-0926</issn><eissn>1532-415X</eissn><coden>CSTMDC</coden><abstract>This article presents a synthetic control chart for detection of shifts in the process median. The synthetic chart is a combination of sign chart and conforming run-length chart. The performance evaluation of the proposed chart indicates that the synthetic chart has a higher power of detecting shifts in process median than the Shewhart charts based on sign statistic as well as the classical Shewhart X-bar chart for various symmetric distributions. The improvement is significant for shifts of moderate to large shifts in the median. The robustness studies of the proposed synthetic control chart against outliers indicate that the proposed synthetic control chart is robust against contamination by outliers.</abstract><cop>Philadelphia, PA</cop><pub>Taylor &amp; Francis Group</pub><doi>10.1080/03610920903249576</doi><tpages>12</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0361-0926
ispartof Communications in statistics. Theory and methods, 2010-01, Vol.39 (18), p.3282-3293
issn 0361-0926
1532-415X
language eng
recordid cdi_informaworld_taylorfrancis_310_1080_03610920903249576
source Taylor and Francis Science and Technology Collection
subjects Applications
Average run length
Control charts
CRL chart
Exact sciences and technology
General topics
Mathematics
Multivariate analysis
Nonparametric control chart
Primary 62G86
Probability and statistics
Reliability, life testing, quality control
Sciences and techniques of general use
Secondary 62P30
Sign statistic
Statistics
Studies
title A Nonparametric Synthetic Control Chart Using Sign Statistic
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T15%3A41%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_infor&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Nonparametric%20Synthetic%20Control%20Chart%20Using%20Sign%20Statistic&rft.jtitle=Communications%20in%20statistics.%20Theory%20and%20methods&rft.au=Khilare,%20S.%20K.&rft.date=2010-01-01&rft.volume=39&rft.issue=18&rft.spage=3282&rft.epage=3293&rft.pages=3282-3293&rft.issn=0361-0926&rft.eissn=1532-415X&rft.coden=CSTMDC&rft_id=info:doi/10.1080/03610920903249576&rft_dat=%3Cproquest_infor%3E849471004%3C/proquest_infor%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c468t-49cf65cd42ed4a5c5e2afe6e8834448d032b9deb7bee812b8af99933a2e6f203%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1286685243&rft_id=info:pmid/&rfr_iscdi=true