The Revised m-of-k Runs Rule

Sensitizing rules based on runs and scans are widely used to increase the sensitivity of the classical Shewhart control chart in detecting small process shifts. The use of these rules frequently results in a substantial reduction of the in-control average run length ARL and/or in a poor performance...

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Bibliographic Details
Published in:Quality engineering 2008-01, Vol.20 (1), p.75-81
Main Authors: Antzoulakos, Demetrios L., Rakitzis, Athanasios C.
Format: Article
Language:English
Subjects:
average run length
Comparative analysis
Control charts
inner control limit
Markov chain embedding technique
outer control limit
Process controls
runs rule
Studies
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Summary:Sensitizing rules based on runs and scans are widely used to increase the sensitivity of the classical Shewhart control chart in detecting small process shifts. The use of these rules frequently results in a substantial reduction of the in-control average run length ARL and/or in a poor performance of the out-of-control average run length for moderate to large process shifts. To overcome these weaknesses, we introduce the revised m-of-k runs rule and we study the average run length performance of the Shewhart control chart supplemented with the revised runs rule. Our extensive numerical experimentation and the comparisons made with other competitive control charts reveal that the revised runs rule demonstrates an improved performance in the detection of small to moderate shifts while maintaining the same superiority for detecting large shifts.
ISSN:0898-2112
1532-4222
DOI:10.1080/08982110701636401