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Young's modulus of thin films using depth-sensing indentation

A new methodology for the determination of Young's modulus of thin films, using a single hardness test measurement of film/substrate composites, has been developed. It is based on a recently proposed weight function, the reciprocal of the Gao function. Firstly, results of three-dimensional nume...

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Bibliographic Details
Published in:Philosophical magazine letters 2010-01, Vol.90 (1), p.9-22
Main Authors: Fernandes, J.V., Antunes, J.M., Sakharova, N.A., Oliveira, M.C., Menezes, L.F.
Format: Article
Language:English
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Summary:A new methodology for the determination of Young's modulus of thin films, using a single hardness test measurement of film/substrate composites, has been developed. It is based on a recently proposed weight function, the reciprocal of the Gao function. Firstly, results of three-dimensional numerical simulation of the Vickers hardness tests on several fictitious composites are considered. Then, the methodology is checked experimentally by using depth-sensing indentation results on real composite materials.
ISSN:0950-0839
1362-3036
DOI:10.1080/09500830903334312