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Second generation liquid source misted chemical deposition (LSMCD) technology for ferroelectric thin films

This paper discusses the second generation liquid source misted chemical deposition (LSMCD) technology currently being developed for ferroelectric thin film deposition. A SubMicron Systems (SMS) Model Primaxx-2F cluster tool was used to deposit the films. The developments that have been made since t...

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Published in:Integrated ferroelectrics 1997-09, Vol.18 (1-4), p.127-136
Main Authors: Solayappan, Narayan, Mcmillan, Larry D., de Araujo, Carlos A. Paz, Grant, Bob
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Language:English
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cited_by cdi_FETCH-LOGICAL-c410t-e1469167de167cb2af5e802cf0646eb72024589076badbfda69b32e4fd43a3643
cites cdi_FETCH-LOGICAL-c410t-e1469167de167cb2af5e802cf0646eb72024589076badbfda69b32e4fd43a3643
container_end_page 136
container_issue 1-4
container_start_page 127
container_title Integrated ferroelectrics
container_volume 18
creator Solayappan, Narayan
Mcmillan, Larry D.
de Araujo, Carlos A. Paz
Grant, Bob
description This paper discusses the second generation liquid source misted chemical deposition (LSMCD) technology currently being developed for ferroelectric thin film deposition. A SubMicron Systems (SMS) Model Primaxx-2F cluster tool was used to deposit the films. The developments that have been made since the first generation machine are discussed. The process chamber schematics along with the characteristics of the aerosol generator are explained in detail. The electrical properties obtained from the films deposited by the tool are found to be similar to that of spin-on films. The step coverage obtained on patterned wafers are also shown. The LSMCD technique combines the advantages of spin-on such as simplicity, good stoichiometry control and superior electrical properties with the advantages of CVD such as superior step coverage, manufacturability, etc.
doi_str_mv 10.1080/10584589708221693
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fullrecord <record><control><sourceid>crossref_infor</sourceid><recordid>TN_cdi_informaworld_taylorfrancis_310_1080_10584589708221693</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1080_10584589708221693</sourcerecordid><originalsourceid>FETCH-LOGICAL-c410t-e1469167de167cb2af5e802cf0646eb72024589076badbfda69b32e4fd43a3643</originalsourceid><addsrcrecordid>eNqFkM1OwzAQhC0EEqXwANx8hEPAjh07kbig8isVcSicI8det66SuNiuoG9PSrlVgsvuSjPfSjMInVNyRUlJrikpSl6UlSRlnlNRsQM0ooLIrORldTjcg54NBnmMTmJcEkJZIcUILWegfW_wHHoIKjnf49Z9rJ3B0a-DBty5mMBgvYDOadViAysf3Y_xYjp7mdxd4gR60fvWzzfY-oAthOChBZ2C0zgtXI-ta7t4io6saiOc_e4xen-4f5s8ZdPXx-fJ7TTTnJKUAeWiokIaGIZucmULKEmuLRFcQCNzkm-DEikaZRprlKgalgO3hjPFBGdjRHd_dfAxBrD1KrhOhU1NSb0tq94ra2Budozrhwid-vShNXVSm9YHG1SvXazZX7j8F9-j6vSV2DenG4OM</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Second generation liquid source misted chemical deposition (LSMCD) technology for ferroelectric thin films</title><source>Taylor and Francis Science and Technology Collection</source><creator>Solayappan, Narayan ; Mcmillan, Larry D. ; de Araujo, Carlos A. Paz ; Grant, Bob</creator><creatorcontrib>Solayappan, Narayan ; Mcmillan, Larry D. ; de Araujo, Carlos A. Paz ; Grant, Bob</creatorcontrib><description>This paper discusses the second generation liquid source misted chemical deposition (LSMCD) technology currently being developed for ferroelectric thin film deposition. A SubMicron Systems (SMS) Model Primaxx-2F cluster tool was used to deposit the films. The developments that have been made since the first generation machine are discussed. The process chamber schematics along with the characteristics of the aerosol generator are explained in detail. The electrical properties obtained from the films deposited by the tool are found to be similar to that of spin-on films. The step coverage obtained on patterned wafers are also shown. The LSMCD technique combines the advantages of spin-on such as simplicity, good stoichiometry control and superior electrical properties with the advantages of CVD such as superior step coverage, manufacturability, etc.</description><identifier>ISSN: 1058-4587</identifier><identifier>EISSN: 1607-8489</identifier><identifier>DOI: 10.1080/10584589708221693</identifier><language>eng</language><publisher>Taylor &amp; Francis Group</publisher><subject>Chemical Solution Deposition ; LSMCD ; SBT ; Thin Films</subject><ispartof>Integrated ferroelectrics, 1997-09, Vol.18 (1-4), p.127-136</ispartof><rights>Copyright Taylor &amp; Francis Group, LLC 1997</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c410t-e1469167de167cb2af5e802cf0646eb72024589076badbfda69b32e4fd43a3643</citedby><cites>FETCH-LOGICAL-c410t-e1469167de167cb2af5e802cf0646eb72024589076badbfda69b32e4fd43a3643</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Solayappan, Narayan</creatorcontrib><creatorcontrib>Mcmillan, Larry D.</creatorcontrib><creatorcontrib>de Araujo, Carlos A. Paz</creatorcontrib><creatorcontrib>Grant, Bob</creatorcontrib><title>Second generation liquid source misted chemical deposition (LSMCD) technology for ferroelectric thin films</title><title>Integrated ferroelectrics</title><description>This paper discusses the second generation liquid source misted chemical deposition (LSMCD) technology currently being developed for ferroelectric thin film deposition. A SubMicron Systems (SMS) Model Primaxx-2F cluster tool was used to deposit the films. The developments that have been made since the first generation machine are discussed. The process chamber schematics along with the characteristics of the aerosol generator are explained in detail. The electrical properties obtained from the films deposited by the tool are found to be similar to that of spin-on films. The step coverage obtained on patterned wafers are also shown. The LSMCD technique combines the advantages of spin-on such as simplicity, good stoichiometry control and superior electrical properties with the advantages of CVD such as superior step coverage, manufacturability, etc.</description><subject>Chemical Solution Deposition</subject><subject>LSMCD</subject><subject>SBT</subject><subject>Thin Films</subject><issn>1058-4587</issn><issn>1607-8489</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNqFkM1OwzAQhC0EEqXwANx8hEPAjh07kbig8isVcSicI8det66SuNiuoG9PSrlVgsvuSjPfSjMInVNyRUlJrikpSl6UlSRlnlNRsQM0ooLIrORldTjcg54NBnmMTmJcEkJZIcUILWegfW_wHHoIKjnf49Z9rJ3B0a-DBty5mMBgvYDOadViAysf3Y_xYjp7mdxd4gR60fvWzzfY-oAthOChBZ2C0zgtXI-ta7t4io6saiOc_e4xen-4f5s8ZdPXx-fJ7TTTnJKUAeWiokIaGIZucmULKEmuLRFcQCNzkm-DEikaZRprlKgalgO3hjPFBGdjRHd_dfAxBrD1KrhOhU1NSb0tq94ra2Budozrhwid-vShNXVSm9YHG1SvXazZX7j8F9-j6vSV2DenG4OM</recordid><startdate>199709</startdate><enddate>199709</enddate><creator>Solayappan, Narayan</creator><creator>Mcmillan, Larry D.</creator><creator>de Araujo, Carlos A. Paz</creator><creator>Grant, Bob</creator><general>Taylor &amp; Francis Group</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>199709</creationdate><title>Second generation liquid source misted chemical deposition (LSMCD) technology for ferroelectric thin films</title><author>Solayappan, Narayan ; Mcmillan, Larry D. ; de Araujo, Carlos A. Paz ; Grant, Bob</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c410t-e1469167de167cb2af5e802cf0646eb72024589076badbfda69b32e4fd43a3643</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Chemical Solution Deposition</topic><topic>LSMCD</topic><topic>SBT</topic><topic>Thin Films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Solayappan, Narayan</creatorcontrib><creatorcontrib>Mcmillan, Larry D.</creatorcontrib><creatorcontrib>de Araujo, Carlos A. Paz</creatorcontrib><creatorcontrib>Grant, Bob</creatorcontrib><collection>CrossRef</collection><jtitle>Integrated ferroelectrics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Solayappan, Narayan</au><au>Mcmillan, Larry D.</au><au>de Araujo, Carlos A. Paz</au><au>Grant, Bob</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Second generation liquid source misted chemical deposition (LSMCD) technology for ferroelectric thin films</atitle><jtitle>Integrated ferroelectrics</jtitle><date>1997-09</date><risdate>1997</risdate><volume>18</volume><issue>1-4</issue><spage>127</spage><epage>136</epage><pages>127-136</pages><issn>1058-4587</issn><eissn>1607-8489</eissn><abstract>This paper discusses the second generation liquid source misted chemical deposition (LSMCD) technology currently being developed for ferroelectric thin film deposition. A SubMicron Systems (SMS) Model Primaxx-2F cluster tool was used to deposit the films. The developments that have been made since the first generation machine are discussed. The process chamber schematics along with the characteristics of the aerosol generator are explained in detail. The electrical properties obtained from the films deposited by the tool are found to be similar to that of spin-on films. The step coverage obtained on patterned wafers are also shown. The LSMCD technique combines the advantages of spin-on such as simplicity, good stoichiometry control and superior electrical properties with the advantages of CVD such as superior step coverage, manufacturability, etc.</abstract><pub>Taylor &amp; Francis Group</pub><doi>10.1080/10584589708221693</doi><tpages>10</tpages></addata></record>
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subjects Chemical Solution Deposition
LSMCD
SBT
Thin Films
title Second generation liquid source misted chemical deposition (LSMCD) technology for ferroelectric thin films
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T17%3A28%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_infor&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Second%20generation%20liquid%20source%20misted%20chemical%20deposition%20(LSMCD)%20technology%20for%20ferroelectric%20thin%20films&rft.jtitle=Integrated%20ferroelectrics&rft.au=Solayappan,%20Narayan&rft.date=1997-09&rft.volume=18&rft.issue=1-4&rft.spage=127&rft.epage=136&rft.pages=127-136&rft.issn=1058-4587&rft.eissn=1607-8489&rft_id=info:doi/10.1080/10584589708221693&rft_dat=%3Ccrossref_infor%3E10_1080_10584589708221693%3C/crossref_infor%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c410t-e1469167de167cb2af5e802cf0646eb72024589076badbfda69b32e4fd43a3643%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true