Electrode effects on the low-frequency dielectric properties of (Ba, Sr)TiO3 thin films prepared by pulsed laser ablation

(Ba, Sr)TiO 3 (BST) thin films were prepared by pulsed laser deposition on the perovskite conductive oxide LaNiO 3 (LNO), YBa 2 Cu 3 O 7−δ (YBCO) films, and Pt as a bottom electrode. The crystalline structures and surface microstructrue of the BST deposited on several substrates were characterized b...

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Bibliographic Details
Published in:Integrated ferroelectrics 1999-01, Vol.24 (1-4), p.33-43
Main Authors: Lee, Su-Jae, Kang, Kwang-Yong, Han, Seok-Kil, Kim, Jin-Woo, Jung, Sang-Don
Format: Article
Language:English
Subjects:
(Ba, Sr)TiO
electrode effect
low-frequency dielectric relaxation
pulsed laser deposition
thin film
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Summary:(Ba, Sr)TiO 3 (BST) thin films were prepared by pulsed laser deposition on the perovskite conductive oxide LaNiO 3 (LNO), YBa 2 Cu 3 O 7−δ (YBCO) films, and Pt as a bottom electrode. The crystalline structures and surface microstructrue of the BST deposited on several substrates were characterized by x-ray diffraction measurement and scanning electron microscopy, respectively. The electrode effects on low-frequency dielectric behavior of BST thin films were investigated. The complex dielectric constants of the films were measured as a function of frequency in the frequency range from 0.1 Hz to 10 MHz. BST films grown on metallic oxide substrates exhibited marked dielectric relaxation below 10 MHz. This low frequency dielectric relaxations is attributed to the ionized space charge carriers such as the oxygen vacancies and cation defects in BST film, and the interfacial polarization in the grain boundary region and the electrode/film interface.
ISSN:1058-4587
1607-8489
DOI:10.1080/10584589908215576