An optimized package test methodology for testing FRAM® memories

As the market for ferroelectric semiconductor memories matures, the FRAM® products manufactured by Ramtron International Corp are moving into mass production. In this scenario, the optimization of the production test flow becomes a key consideration in the profitability of the product. Ramtron Inter...

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Bibliographic Details
Published in:Integrated ferroelectrics 1999-10, Vol.26 (1-4), p.297-310
Main Authors: Mitra, Sanjay, Humes, James
Format: Article
Language:English
Subjects:
ferroelectric
reliability
retention
test optimization
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Summary:As the market for ferroelectric semiconductor memories matures, the FRAM® products manufactured by Ramtron International Corp are moving into mass production. In this scenario, the optimization of the production test flow becomes a key consideration in the profitability of the product. Ramtron International Corp has thus been focussing on developing an optimized production test flow without compromising the final quality of the product.
ISSN:1058-4587
1607-8489
DOI:10.1080/10584589908215630