Investigation of Layer Structure of MHPOBC Free-Standing Film by Transmission Ellipsometry

Thin MHPOBC Free-Standing Film (FSF) was investigated by transmission ellipsometry. It was found that the temperature at which the remarkable change of δ occurs increases with decreasing the layer number, and some of the subphase disappeared in case of thin FSF. The layer thickness of thin FSF was 2...

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Bibliographic Details
Published in:Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals Molecular crystals and liquid crystals, 2001-07, Vol.365 (1), p.835-844
Main Authors: Okumoto, Yoshitaka, Kimura, Munehiro, Akahane, Tadashi, Masuhashi, Nobuaki
Format: Article
Language:English
Subjects:
antiferroelectric liquid crystal
Condensed matter: structure, mechanical and thermal properties
ellipsometry
Exact sciences and technology
Experimental determinations of smectic, nematic, cholesteric, and other structures
free standing Film
Liquid crystals
Liquid thin films
Physics
Structure of solids and liquids
crystallography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:Thin MHPOBC Free-Standing Film (FSF) was investigated by transmission ellipsometry. It was found that the temperature at which the remarkable change of δ occurs increases with decreasing the layer number, and some of the subphase disappeared in case of thin FSF. The layer thickness of thin FSF was 2.5 nm which is shorter than the molecular length, and was not depend on the tilt angle.
ISSN:1058-725X
DOI:10.1080/10587250108025362