Nanoscale polarisation switching and leakage currents in (Ba0.955Ca0.045)(Zr0.17Ti0.83)O3 epitaxial thin films

This paper investigates the crystal structure, ferroelectric, temperature-dependent leakage current conduction mechanism and the piezoresponse force microscopy (PFM) behaviours of (Ba0.955Ca0.045) (Zr0.17Ti0.83)O3-BZT-BCT () films at the vicinity of the morphotropic phase boundary (MPB) of the [(1  ...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2015-09, Vol.48 (35)
Main Authors: Puli, Venkata Sreenivas, Pradhan, Dhiren K, Adireddy, Shiva, Martínez, R, Silwal, Punam, Scott, J F, Ramana, C V, Chrisey, Douglas B, Katiyar, Ram S
Format: Article
Language:English
Subjects:
ferroelectric
imprint
piezoresponse
Online Access:Get full text
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Summary:This paper investigates the crystal structure, ferroelectric, temperature-dependent leakage current conduction mechanism and the piezoresponse force microscopy (PFM) behaviours of (Ba0.955Ca0.045) (Zr0.17Ti0.83)O3-BZT-BCT () films at the vicinity of the morphotropic phase boundary (MPB) of the [(1  −  x) BaZr0.20Ti0.80O3-xBa0.70Ca0.30TiO3] () composition. Epitaxial BZT-BCT thin films were grown on conductive La0.5Sr0.5CoO3 (LSCO) layers coated onto MgO (1 0 0) single-crystal substrates by pulsed laser deposition (PLD). High resolution x-ray diffraction (HR-XRD) reciprocal space maps (RSMs) confirmed the epitaxy with in-plane tetragonal symmetry (c  
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/48/35/355502